GB/T 15616-2008 English PDFUS$169.00 ยท In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 15616-2008: Quantitative method for electron probe microanalysis of metals and alloys Status: Valid GB/T 15616: Historical versions
Basic dataStandard ID: GB/T 15616-2008 (GB/T15616-2008)Description (Translated English): Quantitative method for electron probe microanalysis of metals and alloys Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: N53 Classification of International Standard: 71.040.99 Word Count Estimation: 7,718 Date of Issue: 2008-08-20 Date of Implementation: 2009-04-01 Older Standard (superseded by this standard): GB/T 15616-1995 Quoted Standard: GB/T 4930; GB/T 13298; GB/T 15074; GB/T 20725; ISO 22309-2006; ISO 22489; ISO/IEC 17025 Regulation (derived from): Announcement of Newly Approved National Standards No. 14 of 2008 (total 127) Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China Summary: This standard specifies the use electron microprobe chemical composition of metals and alloys for quantitative analysis. This standard applies to metals and alloys cubic micron scale micro- component analysis, analysis of elements in the range of 11Na ~ 92U. This is also applicable to a configuration of a scanning electron microscope spectrometer of metals and alloys for quantitative analysis. GB/T 15616-2008: Quantitative method for electron probe microanalysis of metals and alloys---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Quantitative method for electron probe microanalysis of metals and alloys ICS 71.040.99 N53 National Standards of People's Republic of China Replacing GB/T 15616-1995 The method of quantitative electron probe microanalysis of metals and alloys Posted 2008-08-20 2009-04-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released ForewordThis standard replaces GB/T 15616-1995 "method of quantitative electron probe microanalysis of metals and alloys." This standard and GB/T 15616-1995 compared to the main changes are as follows. --- In the "program" to remove the original "concentration of 1% or more" requirement, increase "is also applicable to a configuration with a scanning electron spectrometer Micromirrors for quantitative analysis of metals and alloys "requirement; --- Increasing the reference standard; --- Some of the terms according to ISO 23833.2006 has been modified; --- Increase in Chapter 11, "Results Report"; --- Remove the original standard in Appendix A. This standard by the National Standardization Technical Committee microbeam analysis made. This standard by the National Standardization Technical Committee microbeam analysis. This standard was drafted. Iron and Steel Research Institute, Beijing Institute of Aeronautical Materials. Drafters of this standard. Zhuyan Yong, Zhong before Maoyun Jing, Dong Yuzhuo. This standard replaces the standards previously issued as follows. --- GB/T 15616-1995. The method of quantitative electron probe microanalysis of metals and alloys1 ScopeThis standard specifies the chemical composition by electron probe metals and alloys quantitative analysis. This standard applies to metal and alloy samples cubic micron-sized micro-composition analysis, elemental analysis range is 11Na ~ 92U. This standard also applies to the configuration of the spectrometer using a scanning electron microscope for quantitative analysis of metals and alloys.2 Normative referencesThe following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. GB/T 4930 electron probe microanalysis standard specimen General technical requirements GB/T 13298 metal microstructure inspection method GB/T 15074 method of quantitative electron probe microanalysis General GB/T 20725-point analysis of the legal spectrum electron probe microanalysis Guide ISO 22309.2006 microbeam analysis EDS quantitative analysis ISO 22489 micro beam analysis - electron probe microanalysis (EPMA) - spectrometer bulk sample point quantitative analysis method General requirements ISO /IEC 17025 testing and calibration laboratories Analysis Principle 3 Quantitative electron probe microanalysis of metals and alloys is focused electron beam irradiation sample application has a certain energy in the irradiated area inspired Each element of X-rays of different wavelengths, by X-ray crystal spectrometer spectroscopic spectral components, characteristic X-ray intensity of each detection element, and, and Characteristic X-ray intensity of the standard sample under the same test conditions is compared, by the correction calculation, thus obtaining a specimen area of \u200b\u200beach element is excited Prime quality scores.4 instruments and auxiliary equipment4.1 electron microprobe analyzer or spectrometer configuration of a scanning electron microscope 4.2 optical microscope and sample grinding and polishing apparatus 4.3 ultrasonic cleaning device5 standard5.1 Standards should be formed similar to the known component is chemically pure metal or alloy or compound with the specimen. 5.2 Preferred samples meet the standards GB/T 4930 requirements, the absence of a suitable standard samples, choose the appropriate research institution recognized standard Samples, but its performance should be close to or in line with GB/T 4930 requirements, and the results shall be stated in the report.6 Sample6.1 Analysis of the sample surface should be lapping, polishing, polishing surface microstructure obtained, check the sample surface at 200 to 500 times microscope Analysis of the site should be clean, wear marks and other defects. 6.2 when measured plating or diffusion layer components in cross-section, the specimen shall be inlaid or clamped with a jig and then ground and polished to ensure that the test edge Area without chamfer. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 15616-2008_English be delivered?Answer: Upon your order, we will start to translate GB/T 15616-2008_English as soon as possible, and keep you informed of the progress. 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Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.Question 5: Should I purchase the latest version GB/T 15616-2008?Answer: Yes. Unless special scenarios such as technical constraints or academic study, you should always prioritize to purchase the latest version GB/T 15616-2008 even if the enforcement date is in future. Complying with the latest version means that, by default, it also complies with all the earlier versions, technically. |