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GB/T 15244-2013 English PDF

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GB/T 15244-2013: Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
Status: Valid

GB/T 15244: Historical versions

Standard IDUSDBUY PDFLead-DaysStandard Title (Description)Status
GB/T 15244-2013209 Add to Cart 3 days Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry Valid
GB/T 15244-2002279 Add to Cart 3 days Glass of quantitative electron probe analysis method Obsolete
GB/T 15244-1994199 Add to Cart 2 days Quantitative analysis method of electron probe on glasses Obsolete

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Basic data

Standard ID: GB/T 15244-2013 (GB/T15244-2013)
Description (Translated English): Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: G04
Classification of International Standard: 71.040.40
Word Count Estimation: 9,974
Older Standard (superseded by this standard): GB/T 15244-2002
Quoted Standard: GB/T 4930-2008; GB/T 17359-2012; GB/T 17366; GB/T 28634-2012
Regulation (derived from): National Standards Bulletin 2013 No. 10
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies: electron microprobe analyzer (EPMA) and scanning electron microscopy (SEM) X -ray spectrometer (WDS) and energy dispersive spectroscopy (EDS) for silicate glass quantitative analysis methods. This standard applies to silicate glas

GB/T 15244-2013: Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microbeam analysis. Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry ICS 71.040.40 G04 National Standards of People's Republic of China Replacing GB/T 15244-2002 Microbeam analysis quantitative analysis of silicate glass Spectroscopy and spectroscopy Issued on. 2013-07-19 2014-03-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard replaces GB/T 15244-2002 "electron probe quantitative analysis method of Glass" This standard compared with GB/T 15244-2002 main changes as follows. --- To increase the selection principles of the standard sample (see 5.1 and 5.2); --- Delete 5.3 (K-44) and (K-45); --- Increased requirements after sample preparation (see 6.1); --- Modify the sample and standard samples deposited conductive film specific requirements (see 6.3); --- Modify the quantitative analysis instrument before boot time requirements (see 7.1.1); --- Added "analysis region is large, you can also use a coaxial optical microscope electron microprobe analysis to determine the site" (see 7.14); --- Accelerating voltage selection increases the overvoltage ratio requirements by modifying the atomic number of different accelerating voltage selection method (see 7.2.1); --- Increased silicon drift EDS (SDD) of the beam selection method (see 7.2.2); --- Increasing the electron beam scanning method for analyzing unstable glass (see 7.2.3); --- Atomic number range of options to modify the X-ray line system (see 7.2.4); --- Increased SDD spectrometer measurement conditions (see 7.3.3); --- Increasing the X-ray intensity in the measurement time of less than 1% of the requirements (see 7.3.5); --- Increasing the difference between the measurement of light elements (see 8.2); --- Adds no standard EDS quantitative analysis method (see 8.4). The standard micro-beam analysis by the National Standardization Technical Committee (SAC/TC38) and focal points. This standard was drafted. Shanghai Institute of Ceramics, Chinese Academy of Sciences. The main drafters of this standard. Li Xiangting, Zeng Yi, Wu Wei. This standard replaces the standards previously issued as follows. --- GB/T 15244-2002. Microbeam analysis quantitative analysis of silicate glass Spectroscopy and spectroscopy

1 Scope

This standard specifies the electron probe analyzer (EPMA) and scanning electron microscopy (SEM) X-ray spectrometer (WDS) and energy dispersive spectroscopy (EDS) for quantitative analysis of silicate glass. This standard applies to silicate glass samples (including alkali metal silicate glass) spectroscopy (WDX) and spectroscopy (EDX) fixed Quantitative analysis.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 4930-2008 electron probe microanalysis standard specimen technical conditions Guidelines GB/T 17359-2012 micro beam analysis Spectroscopy Quantitative Analysis Electron microprobe GB/T 17366 of mineral and rock specimen preparation GB/T 28634-2012 micro beam analysis electron probe microanalysis bulk sample spectrum Quantitative point analysis

3 Terms and Definitions

The following terms and definitions apply to this document. 3.1 Field mobility field-inducedmigration The internal electric field in the insulator by an electron or ion bombardment caused by the effects of migration of atoms occurs. 3.2 Silicate glass silicateglass Silica glass as a main component. The most commonly used soda lime silicate glass, soda aluminosilicate glass, sodium borosilicate glass, Architectural glass, household glass, most optical glass, glass fibers and the like. 3.3 Ion transport ionmigration In the electron beam irradiation, the sample ions of certain elements of the mobile electron beam spot phenomenon. 3.4 Migration components migrationcomposition In the electron beam irradiation, ion transport elements of the sample occurs. 3.5 Dynamic Measurement dynamicmeasurement X-ray intensity in the measurement sample while the sample method of a mobile station or the electron beam irradiation point.
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