GB/T 13973-2012 English PDFUS$879.00 · In stock
Delivery: <= 6 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 13973-2012: General specification test methods for semiconductor device curve tracers Status: Valid GB/T 13973: Historical versions
Basic dataStandard ID: GB/T 13973-2012 (GB/T13973-2012)Description (Translated English): General specification test methods for semiconductor device curve tracers Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: L85 Classification of International Standard: 17.220 Word Count Estimation: 40,499 Older Standard (superseded by this standard): GB/T 13973-1992; GB/T 13974-1992 Quoted Standard: GB 4793.1-2007; GB 4824; GB/T 6587-2012; GB/T 6592-2010; GB/T 9969; GB/T 17626.2; GB/T 17626.3; GB/T 17626.4; GB/T 17626.6; GB/T 18268.1-2010; SJ/T 10463 Regulation (derived from): National Standards Bulletin No. 41 of 2012 Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China Summary: This standard specifies the semiconductor curve tracers (hereinafter referred to as tracers) the terms and definitions, requirements, test methods, quality inspection rules, labeling, packaging, transportation, storage and so on. This standard applies to GB/T 13973-2012: General specification test methods for semiconductor device curve tracers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.ICS17.220 L85 National Standards of People's Republic of China Replacing GB/T 13973-1992, GB/T 13974-1992 Semiconductor curve tracers General specification Issued on. 2013-06-01 2012-12-31 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released Table of ContentsIntroduction Ⅲ 1 Scope 1 2 Normative references 1 3 Terms and definitions 3.1 General 1 3.2 display section 2 3.3 Y-axis and X-axis deflecting part 2 3.4 stepped portion 3 3.5 Collector scanner section 3 3.6 Other 4 4 Requirements 4 4.1 appearance and structure 4 4.2 size and weight 4 4.3 normal sexual function 4 4.4 Performance Characteristics 4 4.5 Power 8 4.6 Security 8 4.7 Environmental Adaptability 8 4.8 Packaging transport 10 4.9 Electromagnetic Compatibility 10 4.10 power adaptation 10 4.11 Reliability 10 5 Test Method 10 Working conditions 10 5.1 benchmark 5.2 Test conditions 11 5.3 Test requirements 11 Appearance and structure 12 5.4 5.5 Dimensions and weights 12 5.6 normal sexual function 12 5.7 Performance Characteristics 12 28 5.8 Security 5.9 Environmental Adaptability 29 5.10 packing and shipping 29 5.11 Electromagnetic compatibility 30 5.12 power adaptation 30 5.13 Reliability 30 6 Quality Inspection Rule 30 6.1 Inspection classification 30 6.2 Test item 30 6.3 Test Method 30 6.4 Identification Test 30 6.5 Quality conformance inspection 32 7 signs, packaging, transportation and storage 34 7.1 marks 34 7.2 Packaging 34 7.3 Transport 34 7.4 Storage 34 8 random file attachments and equipment 35ForewordThis standard rule according to GB/T 1.1-2009 given draft. This standard replaces GB/T 13973-1992 "semiconductor curve tracers general technical conditions", GB/T 13974-1992 "Semiconductor Pipe curve tracers test methods. " This standard incorporate and adjust the GB/T 13973-1992, GB/T 13974-1992 applicable content. In each of the environmental adaptability The test project in accordance with the relevant provisions of GB/T 6587-2012 "General specification for electronic measuring instruments" in the main changes are as follows. --- Added "Terms and definitions" (see Chapter 3); --- Increasing the "baseline conditions of work" (see 5.1); --- Added "Test conditions" (see 5.2); --- Added "big collector current deflection coefficient" (see 5.7.2.1.3); --- Added "precision resistors reference value" (see Table 3); --- Added "current offset ladder and step voltage offset" (see 5.7.4.6, 5.7.4.7). The standard proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This standard by the National Standardization Technical Committee Electronic Measuring Instruments (SAC/TC153) centralized. This standard was drafted. New Equipment Co., Ltd. Shanghai. The main drafters of this standard. Wu Tsung Su, Xu Zhengjiang, Zhupei Hua, Xu Changfeng, see Yu Yi. This standard replaces the standards previously issued as follows. --- GB/T 13973-1992; --- GB/T 13974-1992. Semiconductor curve tracers General specification1 ScopeThis standard specifies the semiconductor curve tracers (hereinafter referred to as tracers) terms and definitions, requirements, test methods, quality inspection regulations Then, labeling, packaging, transportation, storage and so on. Semiconductor curve tracers This standard applies to testing semiconductor characteristic and DC parameters, but also for having an insertion unit Or semiconductor curve tracers appurtenances. Tracer product standards should meet the requirements of this standard, as tracers of product standards beyond the requirements of this standard should be based on the product label Quasi prevail.2 Normative referencesThe following documents for the application of this document is essential For dated references, only the dated edition applies to this article Member. For undated references, the latest edition (including any amendments) applies to this document. GB 4793.1-2007 measurement, control and laboratory use safety requirements for electrical equipment - Part 1. General requirements GB 4824 industrial, scientific and medical (ISM) radio-frequency equipment - Electromagnetic disturbance characteristics - Limits and methods of measurement GB/T 6587-2012 General specification for electronic measuring instruments GB/T 6592-2010 Electrical and electronic measurement equipment - Expression of performance GB/T 9969 General Industrial Product Manual GB/T 17626.2 electromagnetic compatibility test and measurement techniques - Electrostatic discharge immunity test GB/T 17626.3 electromagnetic compatibility test and measurement technology RFEMS test GB/T 17626.4 Electromagnetic compatibility Testing and measurement techniques - Electrical fast transient burst immunity test GB/T 17626.6 electromagnetic compatibility test and measurement technology RF field induction of immunity to conducted disturbances Part 1 Electrical equipment compatibility requirements GB/T 18268.1-2010 measurement, control and laboratory use. General requirements SJ/T10463 electronic measuring instruments packaging, labeling, transportation, storage requirements3 Terms and DefinitionsGB 4793.1-2007 define the following terms and definitions apply to this document. 3.1 General 3.1.1 Semiconductor curve tracers semiconductordevicescurvetracer One kind can be observed and tested semiconductor characteristic and DC parameters of the instrument on the CRT, CRT, LCD and other display. 3.1.2 Host mainframe Plug-tracer remove some portion other than the insertion unit, which usually consists of high and low voltage power supply, and the other portion of the display circuit. 3.1.3 Plug-in unit plug-inunit Plug-tracers can be replaced parts. Plug it in, the host, to complete certain of its special features, such as, Y (or X) Single deflection ...... |
