GB/T 13178-2008 English PDF

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GB/T 13178-2008: Partially depleted gold silicon surface barrier detectors
Status: Valid

GB/T 13178: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 13178-2008	259	Add to Cart	3 days	Partially depleted gold silicon surface barrier detectors	Valid
GB/T 13178-1991	439	Add to Cart	4 days	Partially depleted gold silicon surface barrier detectors	Obsolete

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Basic data

Standard ID: GB/T 13178-2008 (GB/T13178-2008)
Description (Translated English): Partially depleted gold silicon surface barrier detectors
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: F88
Classification of International Standard: 27.120
Word Count Estimation: 11,159
Date of Issue: 2008-07-02
Date of Implementation: 2009-04-01
Older Standard (superseded by this standard): GB/T 13178-1991
Quoted Standard: GB/T 5201; GB/T 10257-2001
Adopted Standard: IEC 60333-1993, NEQ
Regulation (derived from): Announcement of Newly Approved National Standards No. 11 of 2008 (No. 124 overall)
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies the partially depleted gold silicon surface barrier detectors (referred detector) product classification, technical requirements, test methods, inspection rules. This standard applies to partially depleted gold silicon surface barrier detectors (not including position sensitive detector). Lithium drift gold silicon surface barrier detectors are also available for implementation.

GB/T 13178-2008: Partially depleted gold silicon surface barrier detectors

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Partially depleted gold silicon surface barrier detectors ICS 27.120 F88 National Standards of People's Republic of China Replacing GB/T 13178-1991 Gold silicon surface barrier detector Posted 2008-07-02 2009-04-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

The reference to the standard IEC 60333.1993 "Nuclear Instruments semiconductor charged particle detector test program." This standard replaces GB/T 13178-1991 "gold silicon surface barrier detectors" (hereinafter referred to as the original standard). This standard is retained most of GB/T 13178-1991, the main amendments, as follows. --- Increase Preface; --- Reference the new normative documents; --- Product appearance and structure size to retain only type A, by deleting the original criteria B and C; --- Partially depleted gold silicon surface barrier detectors free to retain only a minimum depletion layer depth is 300μm for a class, and the main performance increase "Allow maximum noise." The standard proposed by China National Nuclear Corporation. This standard by the National Standardization Technical Committee on nuclear instrumentation. This standard was drafted. nuclear (Beijing) Nuclear Instrument Factory. The main drafters of this standard. Li Zhiyong. This standard replaces the previous standard release case. GB/T 13178-1991. Gold silicon surface barrier detector

1 Scope

This standard specifies a partially depleted gold silicon surface barrier detectors (referred to probe) product classification, technical requirements, test methods, inspection regulations The like. This standard applies to partially depleted gold silicon surface barrier detector (not including the position sensitive detector). Lithium drift surface barrier detectors also May refer to.

2 Normative references

The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. GB/T 5201 semiconductor charged particle detector test method (GB/T 5201-1994, neqIEC 60333.1993) GB/T 10257-2001 nuclear instruments and nuclear radiation detectors Quality inspection rule

3 Definitions and symbols

3.1 Terms and Definitions The following terms and definitions apply to this standard. 3.1.1 By the inversion layer on the surface of the junction is formed barrier semiconductor detector. 3.1.2 The radiation-sensitive semiconductor detector for that layer of semiconductor material in which the particle energy loss can be converted into an electrical signal. 3.1.3 Depletion layer of semiconductor material is smaller than the depth of the thickness of the substrate. 3.1.4 Radiation detectors most likely to enter that part of the surface depletion layer. 3.1.5 In the spectrum, the peak of the distribution curve formed by a single, horizontal axis between two points at half the peak difference. 3.1.6 Resolution detector incident particle energy capacity. Usually predetermined energy ray spectral line width at half maximum representation. 3.2 Symbols and codes The following symbols and codes apply to this standard. ......

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