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SJ/T 1147-1993 related PDF English

SJ/T 1147-1993 (SJ/T1147-1993, SJT 1147-1993, SJT1147-1993) & related versions
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SJ/T 1147-1993English179 Add to Cart 2 days Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors SJ/T 1147-1993 Obsolete SJT 1147-1993
SJ 1147-1977EnglishRFQ ASK 3 days (Chinese Industry Standard) SJ 1147-1977 Obsolete SJ 1147-1977


BASIC DATA
Standard ID SJ/T 1147-1993 (SJ/T1147-1993)
Description (Translated English) Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L90
Word Count Estimation 3,365
Date of Issue 1993/12/17
Date of Implementation 1994/6/1
Older Standard (superseded by this standard) SJ 1147-1977
Quoted Standard SJ/T 1145; SJ/T 1146
Drafting Organization Tongling film capacitors total Factory
Administrative Organization Ministry of Electronics Industry Standardization Institute
Regulation (derived from) Industry-Science (2010) No. 77
Summary This standard applies to a thickness under normal weather conditions or under 2 ~ 50��m organic thin film capacitors with high temperature, the frequency of the measured values ??and the tangent of the dielectric loss angle of the dielectric constant 50Hz, 1kHz or 1MHz time.