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GB/T 36229-2018 (GB/T36229-2018, GBT 36229-2018, GBT36229-2018) & related versions
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GB/T 36229-2018: PDF in English (GBT 36229-2018)
GB/T 36229-2018
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 25.120.01
J 62
Reliability assessment method and index of active
optoelectronic protective device
ISSUED ON. MAY 14, 2018
IMPLEMENTED ON. DECEMBER 01, 2018
Issued by. State Administration for Market Regulation;
Standardization Administration of the People's Republic of
China.
Table of Contents
Foreword ... 3 
1 Scope ... 4 
2 Normative references ... 4 
3 Terms and definitions ... 4 
4 Assessment conditions ... 5 
5 Assessment method ... 5 
6 Test methods ... 7 
7 Assessment index ... 10 
8 Determination of assessment results ... 11 
9 Assessment record ... 11 
Annex A (informative) Assessment record of reliability of active optoelectronic
protective device ... 12 
Reliability assessment method and index of active
optoelectronic protective device
1 Scope
This Standard specifies assessment conditions, assessment methods, test
methods, assessment indicators, assessment results and assessment records
for reliability of active optoelectronic protective device.
This Standard is applicable to reliability assessment of active optoelectronic
protective device.
2 Normative references
The following referenced documents are indispensable for the application of
this document. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any
amendments) applies.
GB/T 2900.13, Electrotechnical terminology - Dependability and quality of
service
GB/T 4584, Specification of active opto-electronic protective devices for
presses
GB/T 17626.2-2006, Electromagnetic compatibility(EMC) - Testing and
measurement techniques - Electrostatic discharge immunity test
GB/T 17626.4-2008, Electromagnetic compatibility - Testing and
measurement techniques - Electrical fast transient/burst immunity test
GB/T 17626.5-2008, Electromagnetic compatibility - Testing and
measurement techniques - Surge immunity test
3 Terms and definitions
For the purposes of this document, the terms and definitions specified in GB/T
2900.13, GB/T 4584 apply.
5.5.3 Detection after test
After the test, the sample shall be subjected to the sensing function, response
time and anti-electromagnetic interference detection test according to the
requirements of Clause 6. If the test result does not meet the requirements after
the test, it is considered that the sample is invalid. The expiration time is based
on the number of times at the end of the test.
6 Test methods
6.1 Induction function
6.1.1 Light-passing function
Under the conditions of use specified by the sample, the active optoelectronic
protective device shall have a light-passing function, that is, when there is no
shade in the light curtain area, the light curtain shall continue to pass light, and
the active optoelectronic protective device outputs an "on" switch state signal.
The active optoelectronic protective device shall have an induction function
under the conditions of use specified in the sample. When the light-shielding
rod (test piece) enters the light curtain area, the active optoelectronic protective
device shall respond within the response time and output an "off" switch status
signal. When the light-shielding rod (test piece) is removed from the light curtain
area, the light curtain shall be re-transmitted, and the active optoelectronic
protective device output switch status signal shall change from "off" to "on".
6.1.2 Light-passing test (A test)
The light curtain of the active optoelectronic protective device is illuminated
within the rated protection length without interference or other specified events
in the detection zone. Observe the output status signal of the active
optoelectronic protective device for at least 5s. Unless otherwise specified,
OSSD(s) shall be on during this period and shall not be disconnected.
6.1.3 Induction function test (B test)
6.1.3.1 The light curtain of the active optoelectronic protective device is
illuminated within the rated protection length without interference or other
specified events in the detection zone. Observe the output status signal of the
active optoelectronic protective device for at least 5s. Unless otherwise
specified, OSSD(s) shall be on during this period and shall not be disconnected.
6.1.3.2 Put the test piece into the detection area or start the specified event.
During the response time, the output status signal of the active optoelectronic
protective device shall be switched from the on state to the off state. Observe
the output status signal for at least 5s. Unless otherwise specified, the output
optoelectronic protective device is not less than 106 times.
8 Determination of assessment results
8.1 The average number of trouble-free operations (life) per sample is the
number of trials at the time of failure.
8.2 The average number of trouble-free operations (life) of the active
optoelectronic protective device is based on the average of all test samples.
8.3 There is no sample failure during the reliability assessment, and the service
life is the set test time (number of times).
9 Assessment record
9.1 An assessment record shall be established for each sample. And perform
test data recording in sequential order. The content of the record shall be.
a) Sample name, model, specification;
b) Manufacturer and date of manufacture;
c) Test date and number of samples;
d) Test conditions;
e) Failure sample number and related test times;
f) Failure phenomenon;
g) Failure analysis and judgment;
h) Tester.
9.2 See Annex A for the recommended assessment report format.
......

BASIC DATA
Standard ID GB/T 36229-2018 (GB/T36229-2018)
Description (Translated English) Reliability assessment method and index of active opto-electronic protective devices
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard J62
Classification of International Standard 25.120.01
Word Count Estimation 8,836
Date of Issue 2018-05-14
Date of Implementation 2018-12-01
Drafting Organization Shandong Laien Optoelectronics Technology Co., Ltd., Shenzhen Huashen Testing Co., Ltd., Jinan Foundry & Forging Machinery Research Institute Co., Ltd., Fujian Shengxuan Technology Co., Ltd., Quanzhou Zhongzheng Standardization Research Institute Co., Ltd.
Administrative Organization National Forging Machinery Standardization Technical Committee (SAC/TC 220)
Regulation (derived from) National Standards Announcement No. 6 of 2018
Proposing organization China Machinery Industry Federation
Issuing agency(ies) State Administration of Markets and China National Standardization Administration