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YS/T 1703-2024 English PDF

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
YS/T 1703-2024EnglishRFQ ASK 3 days [Need to translate] (Testing of surface particles on wafer packaging boxes - Liquid particle counting method) Valid YS/T 1703-2024

Basic data

Standard ID YS/T 1703-2024 (YS/T1703-2024)
Description (Translated English) (Testing of surface particles on wafer packaging boxes - Liquid particle counting method)
Sector / Industry Nonferrous Metallurgy Industry Standard (Recommended)
Classification of Chinese Standard H17
Classification of International Standard 77.04
Date of Issue 2024-10-24
Date of Implementation 2025-05-01
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the method for testing the surface particles of wafer packaging boxes with a liquid particle counter. This standard is applicable to the test of particle cleanliness of silicon polished wafers, silicon epitaxial wafers, SOI wafers and other materials of semiconductor wafer packaging boxes with diameters of 100mm, 125mm, 150mm, 200mm, and 300mm.

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