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SJ/T 1147-1993 English PDF

SJ/T 1147-1993 (SJ/T1147-1993, SJT 1147-1993, SJT1147-1993)
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SJ/T 1147-1993English179 Add to Cart 2 days [Need to translate] Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors Obsolete SJ/T 1147-1993


BASIC DATA
Standard ID SJ/T 1147-1993 (SJ/T1147-1993)
Description (Translated English) Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L90
Word Count Estimation 3,365
Date of Issue 1993/12/17
Date of Implementation 1994/6/1
Older Standard (superseded by this standard) SJ 1147-1977
Quoted Standard SJ/T 1145; SJ/T 1146
Drafting Organization Tongling film capacitors total Factory
Administrative Organization Ministry of Electronics Industry Standardization Institute
Regulation (derived from) Industry-Science (2010) No. 77
Summary This standard applies to a thickness under normal weather conditions or under 2 ~ 50��m organic thin film capacitors with high temperature, the frequency of the measured values ??and the tangent of the dielectric loss angle of the dielectric constant 50Hz, 1kHz or 1MHz time.

Standards related to: SJ/T 1147-1993

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