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JJF 1016-2014 PDF English

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JJF 1016-2014: The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments
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JJF 1016: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] deliveryName of Chinese StandardStatus
JJF 1016-2014English180 Add to Cart 0-9 seconds. Auto-delivery The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Valid
JJF 1016-2009English399 Add to Cart 3 days The Rules for Drafting Program of Pattern. Evaluation of Measuring Instruments Obsolete
JJF 1016-2002English359 Add to Cart 3 days The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Obsolete
JJF 1016-1990English279 Add to Cart 3 days Rules for Drafting Norms of Pattern Evaluation of Measuring Instruments Obsolete

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JJF 1016-2014: The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments

---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/JJF1016-2014
NATIONAL METROLOGY TECHINICAL SPECIFICATION The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Issued on. JANUARY 23, 2014 Implemented on. JULY 23, 2014 Issued by. General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China Jurisdiction organization. National Technical Committee on Legal Metrology and Management Metrology Drafting organizations. Beijing Institute of Metrology Beijing Municipal Administration of Quality and Technology Supervision China Institute of Metrology National Technical Committee on Legal Metrology and Management Metrology is entrusted for interpretation of this Rules Replacing JJF 1016-2009 The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Drafters of this Rules. Wang, Zigang (Beijing Institute of Metrology) Chen, Jinghua (Beijing Municipal Administration of Quality and Technology Supervision) He, Zhao (China Institute of Metrology)

Table of Contents

Introduction... 5 1 Scope... 6 2 References... 6 3 Terms and definitions... 6 4 General... 7 5 Composition of the program of pattern evaluation... 7 6 Contents of each component of the program of pattern evaluation... 8 7 Editing detailed rules... 16 Annex A Pattern evaluation record format... 17

1 Scope

This Rules applies to the drafting of program of pattern evaluation of measuring instruments.

2 References

JJF 1002-2010 The rules for drafting national metrological verification regulation JJF 1051 Designation and classification code for measuring instrument JJF 1094 Evaluation of the characteristics of measuring instruments GB/T 17799.1 Electromagnetic compatibility - Generic standards - Immunity for residential, commercial and light-industrial environments GB/T 17799.2 Electromagnetic compatibility - Generic standards - Immunity for industrial environments For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.

3 Terms and definitions

For the purpose of this Rules, the terms and definitions defined in JJF 1001 “General Terms in Metrology and Their Definitions” and the following apply. 3.1 Single product A product of only one specification or model. 3.2 Series product A group of products having the same measurement principle, similar structure (appearance) and satisfying one of the following conditions.

4 General

The program of pattern evaluation of measuring instruments is the technical basis for the pattern evaluation of measuring instruments, and its drafting shall meet the following requirements.

5 Composition of the program of pattern evaluation

The composition and drafting sequence of the program of pattern evaluation are as follows.

6 Contents of each component of the program of pattern evaluation

6.1 Cover The cover includes the name, serial number, issuing (approval) organization, and date of implementation of the program of pattern evaluation (in English and Chinese). 6.2 Title page The title page includes information such as the jurisdiction organization, drafting organization, and drafter. 6.3 Table of contents The table of contents shall list the serial number, title and page number of the clause, first-level subclause and annex. The title and page number are connected by a dotted line. 6.4 Introduction The introduction is not numbered and shall include the following. the rules on which the program is based; extent or situation of using technical standards such as international recommendations, international documents, international standards, national standards, and industry standards. 6.5 Scope The name and classification code shall be given according to JJF 1051.If the measuring instrument may have other names, it shall be listed in detail. If necessary, it shall clearly write out the measuring instruments that are not applicable. 6.6 References The serial number and name of the references shall be listed. The list of references is in the order of. national metrology technical regulations, national standards, international recommendations, international documents, international standards, and industry standards. 6.7 Terms For the terms used in the program of pattern evaluation, if they not specified in the current national terminology technical specifications, they shall be defined or stated in the program. 6.8 General The general section briefly describes the principle, construction, and applications of measuring instruments and identifies which are the critical components and materials that affect the metrological performance, and lists the critical components and materials in tabular form. 6.10 Measurement requirements Based JJF 1094 and with reference to national metrology technical specifications, the specific requirements for the metrological performance of measuring instruments are put forward. 6.11 General technical requirements The relevant technical requirements shall be put forward with reference to the relevant product standards and according to the working conditions and environmental conditions of measuring instruments. The technical requirements shall be such that. 6.11.1 Appearance and structure 6.11.2 Functional requirements It shall put forward the most basic functional requirements for measuring instruments with reference to the relevant product standards. 6.11.3 Environmental adaptability It shall generally be described as “The measuring instruments shall work properly in the following environments”. 6.11.4 Stability The requirements for the stability test are put forward with reference to the relevant product standards or metrology technical specifications. 6.13 Number of prototypes provided and way of using a prototype 6.13.1 Number of prototypes provided Determine the number of prototypes according to the following principles. 6.13.1.1 For single products, provide one to three prototypes. 6.14 Test methods and conditions of test items and data processing and qualification criteria The metrological performance test shall be carried out under the reference conditions and rated conditions, respectively. The reference conditions shall be determined and the tests under rated conditions shall be carried out according to the relevant specifications. 6.15 List of measuring instruments and equipment used in test items The measuring instruments and equipment used in test items are filled in by the following list.

7 Editing detailed rules

Implement according to the provisions of Clauses 6 and 7 of JJF 1002-2010. JJF 1016-2014 NATIONAL METROLOGY TECHINICAL SPECIFICATION The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Issued on. JANUARY 23, 2014 Implemented on. JULY 23, 2014 Issued by. General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China Jurisdiction organization. National Technical Committee on Legal Metrology and Management Metrology Drafting organizations. Beijing Institute of Metrology Beijing Municipal Administration of Quality and Technology Supervision China Institute of Metrology National Technical Committee on Legal Metrology and Management Metrology is entrusted for interpretation of this Rules Replacing JJF 1016-2009 The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments Drafters of this Rules. Wang, Zigang (Beijing Institute of Metrology) Chen, Jinghua (Beijing Municipal Administration of Quality and Technology Supervision) He, Zhao (China Institute of Metrology)

Table of Contents

Introduction... 5 1 Scope... 6 2 References... 6 3 Terms and definitions... 6 4 General... 7 5 Composition of the program of pattern evaluation... 7 6 Contents of each component of the program of pattern evaluation... 8 7 Editing detailed rules... 16 Annex A Pattern evaluation record format... 17

1 Scope

This Rules applies to the drafting of program of pattern evaluation of measuring instruments.

2 References

JJF 1002-2010 The rules for drafting national metrological verification regulation JJF 1051 Designation and classification code for measuring instrument JJF 1094 Evaluation of the characteristics of measuring instruments GB/T 17799.1 Electromagnetic compatibility - Generic standards - Immunity for residential, commercial and light-industrial environments GB/T 17799.2 Electromagnetic compatibility - Generic standards - Immunity for industrial environments For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.

3 Terms and definitions

For the purpose of this Rules, the terms and definitions defined in JJF 1001 “General Terms in Metrology and Their Definitions” and the following apply. 3.1 Single product A product of only one specification or model. 3.2 Series product A group of products having the same measurement principle, similar structure (appearance) and satisfying one of the following conditions.

4 General

The program of pattern evaluation of measuring instruments is the technical basis for the pattern evaluation of measuring instruments, and its drafting shall meet the following requirements.

5 Composition of the program of pattern evaluation

The composition and drafting sequence of the program of pattern evaluation are as follows.

6 Contents of each component of the program of pattern evaluation

6.1 Cover The cover includes the name, serial number, issuing (approval) organization, and date of implementation of the program of pattern evaluation (in English and Chinese). 6.2 Title page The title page includes information such as the jurisdiction organization, drafting organization, and drafter. 6.3 Table of contents The table of contents shall list the serial number, title and page number of the clause, first-level subclause and annex. The title and page number are connected by a dotted line. 6.4 Introduction The introduction is not numbered and shall include the following. the rules on which the program is based; extent or situation of using technical standards such as international recommendations, international documents, international standards, national standards, and industry standards. 6.5 Scope The name and classification code shall be given according to JJF 1051.If the measuring instrument may have other names, it shall be listed in detail. If necessary, it shall clearly write out the measuring instruments that are not applicable. 6.6 References The serial number and name of the references shall be listed. The list of references is in the order of. national metrology technical regulations, national standards, international recommendations, international documents, international standards, and industry standards. 6.7 Terms For the terms used in the program of pattern evaluation, if they not specified in the current national terminology technical specifications, they shall be defined or stated in the program. 6.8 General The general section briefly describes the principle, construction, and applications of measuring instruments and identifies which are the critical components and materials that affect the metrological performance, and lists the critical components and materials in tabular form. 6.10 Measurement requirements Based JJF 1094 and with reference to national metrology technical specifications, the specific requirements for the metrological performance of measuring instruments are put forward. 6.11 General technical requirements The relevant technical requirements shall be put forward with reference to the relevant product standards and according to the working conditions and environmental conditions of measuring instruments. The technical requirements shall be such that. 6.11.1 Appearance and structure 6.11.2 Functional requirements It shall put forward the most basic functional requirements for measuring instruments with reference to the relevant product standards. 6.11.3 Environmental adaptability It shall generally be described as “The measuring instruments shall work properly in the following environments”. 6.11.4 Stability The requirements for the stability test are put forward with reference to the relevant product standards or metrology technical specifications. 6.13 Number of prototypes provided and way of using a prototype 6.13.1 Number of prototypes provided Determine the number of prototypes according to the following principles. 6.13.1.1 For single products, provide one to three prototypes. 6.14 Test methods and conditions of test items and data processing and qualification criteria The metrological performance test shall be carried out under the reference conditions and rated conditions, respectively. The reference conditions shall be determined and the tests under rated conditions shall be carried out according to the relevant specifications. 6.15 List of measuring instruments and equipment used in test items The measuring instruments and equipment used in test items are filled in by the following list.

7 Editing detailed rules

Implement according to the provisions of Clauses 6 and 7 of JJF 1002-2010. ......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.


      

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