JJF 1015-2014 PDF English
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General Norm for Pattern Evaluation of Measuring Instruments
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General norm for pattern evaluation and pattern approval of measuring instruments
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| JJF 1015-1990 | English | 759 |
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JJF 1015-2014: General Norm for Pattern Evaluation of Measuring Instruments---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/JJF1015-2014
NATIONAL METROLOGY TECHNICAL SPECIFICATION
OF THE PEOPLE'S REPUBLIC OF CHINA
Replacing JJF 1015-2002
General Norm for Pattern Evaluation of
Measuring Instruments
Issued on. JANUARY 23, 2014
Implemented on. JULY 23, 2014
Issued by. General Administration of Quality Supervision, Inspection and
Quarantine
General Norm for Pattern Evaluation
of Measuring Instruments
Replacing JJF 1015-2002
Jurisdiction organization. National Technical Committee of Legal Metrology
Metering Management
Drafting organizations. Beijing Institute of Metrology Detection
Beijing Bureau of Quality and Technical Supervision
China National Institute of Metrology
This Norm is entrusted to National Technical Committee of Legal Metrology
Metering Management for the interpretation.
Drafters of this Norm.
Wang, Zigang (Beijing Institute of Metrology Detection)
Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision)
He, Zhao (China National Institute of Metrology).
Table of Contents
Foreword... 5
1 Scope... 7
2 Normative references... 7
3 Terms and definitions... 7
4 Technical information and test prototype that shall be submitted by the
application organization... 8
5 Pattern evaluation... 9
6 Handling of test prototype... 12
7 Handling of technical information... 13
Annex A Pattern Evaluation Report Format... 14
Annex B Format for “Explanation” on Prototype Retention of Pattern Evaluation
... 19
Foreword
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" is a guiding technical specification for pattern evaluation of
measuring instruments.
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" was modified on the basis of JJF 1015-2002 "General Norm for
Pattern Evaluation and Pattern Approval of Measuring Instruments", which
references to partial contents of No.19 "Pattern evaluation and pattern
approval" of International Organization for Legal Metrology (OIML) and
combines with the relevant requirements proposed by the metrological
administrative department.
Compared with JJF 1015-2002, this Norm is only related to the pattern
evaluation of the measuring instruments. The pattern approval shall be
specified by relevant documents issued by the metrological administrative
department. The main changes of this revision are as follows.
- Add terms "single product" and "series product" (see 3.3 and 3.4);
- Add "Application for Pattern Approval of Measuring Instruments that was
accepted and entrusted by the government metrological administrative
department" in the submitted technical information (see 4.1);
- Make significant change in the submitted test prototype (see 4.2);
- Improve the approved pattern or specify the basis-change of the previous
pattern evaluation (see 5.1);
- Refine the examination of technical information to make it more operatable
(see 5.2);
- Divide the pattern evaluation into observation project and test project, so
as easy for description (see 5.3 and 5.4);
- Add "function verification" (see 5.4.1);
- Refine "stability test" (see 5.4.7);
- Change the way of "determination of pattern evaluation result"; it shall be
determined as qualified only when all the items for evaluation are qualified
(see 5.5);
- Enrich the "pattern evaluation report" by requiring records and photos to be
listed in the report as attachment (see 5.6);
- Change the handling of test prototype (see 6);
- Refine the "notices" of "pattern evaluation report" and specify 15-day
appeal period (see Appendix A);
- Add tables of "measurement parameters for measuring instruments",
"critical parts and materials", "list of equipment for pattern evaluation" and
"list of evaluation items and evaluation results";
- Delete contents relating to pattern approval;
- Delete basic safety test;
- Delete tests for adaptability of measuring performance in transport
simulation and retention simulation;
- Delete "handling for the first test failure".
The previous versions of this Norm are.
- JJF 1015-2002;
- JJF 1015-1990.
General Norm for Pattern Evaluation
of Measuring Instruments
1 Scope
This Norm is applicable to pattern evaluation of measuring instruments and
approved pattern’s compliance examination.
2 Normative references
This Norm takes the following documents as reference.
JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments;
JJF 1051 Designation and Classification Code for Measuring Instruments;
JJF 1069 Rules for the Examination of the Service of Legal Metrological
Verification.
For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments)
applies.
3 Terms and definitions
Terms and definitions defined by JJF 1001 "General Terms in Metrology and
Their Definitions" AND the following terms and definitions are applicable to this
Norm.
3.1 Measuring instrument
The single device or combination with one or multiple auxiliary equipment,
which are used for measuring.
3.3 Single product
The product of one specification or model.
3.4 Series product
A group of products with same measuring principle, same or similar structure
(appearance), which meet one of the following conditions.
4 Technical information and test prototype that shall
be submitted by the application organization
The applicant shall provide the technical information and test prototype required
by pattern evaluation to the technical agency who undertakes the pattern
evaluation.
4.1 Technical information
The following technical information shall be provided in two-sets by the
applicant.
4.2 Test prototype
The technical agency who undertakes the pattern evaluation shall require the
applicant to provide the test prototype according to provisions of pattern
evaluation outline if there is any; otherwise, determine the specification and
quantity of the prototype according to provisions of 6.13 of JJF 1016-2014.
5 Pattern evaluation
5.1 General principles
The pattern evaluation shall be carried out according to the pattern evaluation
outline.
5.2 Review of technical information
5.2.1 Comparing with 4.1 of this Norm, review if the technical information is
complete.
5.2.2 Review if the units of measurement, the external structure, marks, anti-
spoofing measures, etc. are in line with the legal management requirements.
Meanwhile, review if the names of measuring instruments comply with
provisions of JJF 1051 and the "Catalogue of Measuring Instruments under the
Legal Administration of the People's Republic of China (Pattern Approval)."
5.3 Observation item evaluation
Evaluate the items requiring no test in legal management requirements,
metering requirements and common technical requirements proposed by the
pattern evaluation outline, and fill the observation record table with evaluation
conclusion of each item.
5.4 Evaluation of test item
It shall record test data and test results of the following tests.
5.4.1 Function verification
Verify if the measuring instrument is equipped with each function specified in
the pattern evaluation outline, and if each function meets the requirements.
5.4.6 Test of power environment adaptation
Carry out the test under the power environment specified in the pattern
evaluation outline.
5.4.7 Stability test
Carry out the stability test according to provisions of the pattern evaluation
outline.
5.4.7.1 Carry out the test of measuring performance under reference conditions.
5.5 Determination of pattern evaluation result
5.5.1 It is qualified when all the evaluation items of the prototype comply with
the requirements of the pattern evaluation outline.
5.6 Issue of pattern evaluation report
After tests are completed, issue the pattern evaluation report according to the
format requirements in Appendix A. Reports shall be respectively issued for
series products with different measuring performance.
5.7 Handling of unqualified pattern evaluation
When the audited technical information is found non-conformance, it shall
inform the applicant to conduct rectification.
5.8 Confidentiality of prototype and technical information
The technical agency shall keep the prototype, technical information and
evaluation results confidential according to requirements of JJF 1069 during
pattern evaluation and after pattern evaluation.
6 Handling of test prototype
6.1 Handling of qualified prototype
6.1.1 Seal and mark of prototype
The technical agency who undertakes the pattern evaluation shall make
effective seal and mark to the qualified prototype or critical components. The
mark shall be obviously pasted and the mark format is shown in Appendix B.
6.2 Handling of unqualified prototype
After pattern evaluation is completed, for unqualified prototypes, they shall be
returned to the applicant after reconsideration period is over.
7 Handling of technical information
After the pattern evaluation is completed (qualified or unqualified), the technical
information submitted by the applicant shall be handled in the following ways.
JJF 1015-2014
NATIONAL METROLOGY TECHNICAL SPECIFICATION
OF THE PEOPLE'S REPUBLIC OF CHINA
Replacing JJF 1015-2002
General Norm for Pattern Evaluation of
Measuring Instruments
Issued on. JANUARY 23, 2014
Implemented on. JULY 23, 2014
Issued by. General Administration of Quality Supervision, Inspection and
Quarantine
General Norm for Pattern Evaluation
of Measuring Instruments
Replacing JJF 1015-2002
Jurisdiction organization. National Technical Committee of Legal Metrology
Metering Management
Drafting organizations. Beijing Institute of Metrology Detection
Beijing Bureau of Quality and Technical Supervision
China National Institute of Metrology
This Norm is entrusted to National Technical Committee of Legal Metrology
Metering Management for the interpretation.
Drafters of this Norm.
Wang, Zigang (Beijing Institute of Metrology Detection)
Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision)
He, Zhao (China National Institute of Metrology).
Table of Contents
Foreword... 5
1 Scope... 7
2 Normative references... 7
3 Terms and definitions... 7
4 Technical information and test prototype that shall be submitted by the
application organization... 8
5 Pattern evaluation... 9
6 Handling of test prototype... 12
7 Handling of technical information... 13
Annex A Pattern Evaluation Report Format... 14
Annex B Format for “Explanation” on Prototype Retention of Pattern Evaluation
... 19
Foreword
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" is a guiding technical specification for pattern evaluation of
measuring instruments.
JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring
Instruments" was modified on the basis of JJF 1015-2002 "General Norm for
Pattern Evaluation and Pattern Approval of Measuring Instruments", which
references to partial contents of No.19 "Pattern evaluation and pattern
approval" of International Organization for Legal Metrology (OIML) and
combines with the relevant requirements proposed by the metrological
administrative department.
Compared with JJF 1015-2002, this Norm is only related to the pattern
evaluation of the measuring instruments. The pattern approval shall be
specified by relevant documents issued by the metrological administrative
department. The main changes of this revision are as follows.
- Add terms "single product" and "series product" (see 3.3 and 3.4);
- Add "Application for Pattern Approval of Measuring Instruments that was
accepted and entrusted by the government metrological administrative
department" in the submitted technical information (see 4.1);
- Make significant change in the submitted test prototype (see 4.2);
- Improve the approved pattern or specify the basis-change of the previous
pattern evaluation (see 5.1);
- Refine the examination of technical information to make it more operatable
(see 5.2);
- Divide the pattern evaluation into observation project and test project, so
as easy for description (see 5.3 and 5.4);
- Add "function verification" (see 5.4.1);
- Refine "stability test" (see 5.4.7);
- Change the way of "determination of pattern evaluation result"; it shall be
determined as qualified only when all the items for evaluation are qualified
(see 5.5);
- Enrich the "pattern evaluation report" by requiring records and photos to be
listed in the report as attachment (see 5.6);
- Change the handling of test prototype (see 6);
- Refine the "notices" of "pattern evaluation report" and specify 15-day
appeal period (see Appendix A);
- Add tables of "measurement parameters for measuring instruments",
"critical parts and materials", "list of equipment for pattern evaluation" and
"list of evaluation items and evaluation results";
- Delete contents relating to pattern approval;
- Delete basic safety test;
- Delete tests for adaptability of measuring performance in transport
simulation and retention simulation;
- Delete "handling for the first test failure".
The previous versions of this Norm are.
- JJF 1015-2002;
- JJF 1015-1990.
General Norm for Pattern Evaluation
of Measuring Instruments
1 Scope
This Norm is applicable to pattern evaluation of measuring instruments and
approved pattern’s compliance examination.
2 Normative references
This Norm takes the following documents as reference.
JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments;
JJF 1051 Designation and Classification Code for Measuring Instruments;
JJF 1069 Rules for the Examination of the Service of Legal Metrological
Verification.
For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments)
applies.
3 Terms and definitions
Terms and definitions defined by JJF 1001 "General Terms in Metrology and
Their Definitions" AND the following terms and definitions are applicable to this
Norm.
3.1 Measuring instrument
The single device or combination with one or multiple auxiliary equipment,
which are used for measuring.
3.3 Single product
The product of one specification or model.
3.4 Series product
A group of products with same measuring principle, same or similar structure
(appearance), which meet one of the following conditions.
4 Technical information and test prototype that shall
be submitted by the application organization
The applicant shall provide the technical information and test prototype required
by pattern evaluation to the technical agency who undertakes the pattern
evaluation.
4.1 Technical information
The following technical information shall be provided in two-sets by the
applicant.
4.2 Test prototype
The technical agency who undertakes the pattern evaluation shall require the
applicant to provide the test prototype according to provisions of pattern
evaluation outline if there is any; otherwise, determine the specification and
quantity of the prototype according to provisions of 6.13 of JJF 1016-2014.
5 Pattern evaluation
5.1 General principles
The pattern evaluation shall be carried out according to the pattern evaluation
outline.
5.2 Review of technical information
5.2.1 Comparing with 4.1 of this Norm, review if the technical information is
complete.
5.2.2 Review if the units of measurement, the external structure, marks, anti-
spoofing measures, etc. are in line with the legal management requirements.
Meanwhile, review if the names of measuring instruments comply with
provisions of JJF 1051 and the "Catalogue of Measuring Instruments under the
Legal Administration of the People's Republic of China (Pattern Approval)."
5.3 Observation item evaluation
Evaluate the items requiring no test in legal management requirements,
metering requirements and common technical requirements proposed by the
pattern evaluation outline, and fill the observation record table with evaluation
conclusion of each item.
5.4 Evaluation of test item
It shall record test data and test results of the following tests.
5.4.1 Function verification
Verify if the measuring instrument is equipped with each function specified in
the pattern evaluation outline, and if each function meets the requirements.
5.4.6 Test of power environment adaptation
Carry out the test under the power environment specified in the pattern
evaluation outline.
5.4.7 Stability test
Carry out the stability test according to provisions of the pattern evaluation
outline.
5.4.7.1 Carry out the test of measuring performance under reference conditions.
5.5 Determination of pattern evaluation result
5.5.1 It is qualified when all the evaluation items of the prototype comply with
the requirements of the pattern evaluation outline.
5.6 Issue of pattern evaluation report
After tests are completed, issue the pattern evaluation report according to the
format requirements in Appendix A. Reports shall be respectively issued for
series products with different measuring performance.
5.7 Handling of unqualified pattern evaluation
When the audited technical information is found non-conformance, it shall
inform the applicant to conduct rectification.
5.8 Confidentiality of prototype and technical information
The technical agency shall keep the prototype, technical information and
evaluation results confidential according to requirements of JJF 1069 during
pattern evaluation and after pattern evaluation.
6 Handling of test prototype
6.1 Handling of qualified prototype
6.1.1 Seal and mark of prototype
The technical agency who undertakes the pattern evaluation shall make
effective seal and mark to the qualified prototype or critical components. The
mark shall be obviously pasted and the mark format is shown in Appendix B.
6.2 Handling of unqualified prototype
After pattern evaluation is completed, for unqualified prototypes, they shall be
returned to the applicant after reconsideration period is over.
7 Handling of technical information
After the pattern evaluation is completed (qualified or unqualified), the technical
information submitted by the applicant shall be handled in the following ways.
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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