GB/T 33014.4-2016_English: PDF (GB/T33014.4-2016)
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 33014.4-2016 | English | 125 |
Add to Cart
|
0--9 seconds. Auto-delivery
|
Road vehicles -- Component test methods for electrical/electronic disturbances from narrowband radiated electromagnetic energy -- Part 4: Bulk current injection (BCI)
| Valid |
GB/T 33014.4-2016
|
| Standard ID | GB/T 33014.4-2016 (GB/T33014.4-2016) | | Description (Translated English) | Road vehicles -- Component test methods for electrical/electronic disturbances from narrowband radiated electromagnetic energy -- Part 4: Bulk current injection (BCI) | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | T36 | | Classification of International Standard | 43.040.10 | | Word Count Estimation | 18,122 | | Date of Issue | 2016-10-13 | | Date of Implementation | 2017-11-01 | | Drafting Organization | China Automotive Technology Research Center, Shenzhen City Hang Sheng Electronics Co., Ltd., China Testing Technology Co., Ltd., Shanghai Automotive Group passenger car company, Suzhou Tai Site Electronic Technology Co., Ltd., China Electronic Technology Standardization Institute, Shanghai Volkswagen Co., Ltd., Changchun Automobile Testing Center, Shenzhen BYD Automobile Co., Ltd., BMW (China) Automobile Trading Co., Ltd., Denso (China) Investment Co., Ltd. | | Administrative Organization | National Automobile Standardization Technical Committee (SAC/TC 114) | | Regulation (derived from) | National Standard Notice No.1716 of 2016 | | Proposing organization | Ministry of Industry and Information Technology of the People Republic of China | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People Republic of China, China National Standardization Administration Committee |
GB/T 33014.4-2016
Road vehicles - Component test methods for electrical/electronic disturbances from narrowband radiated electromagnetic energy - Part 4. Bulk current injection (BCI)
ICS 43.040.10
T36
National Standards of People's Republic of China
Road vehicle electrical/electronic components for narrowband radiation
Electromagnetic energy immunity test method
Part 4. High Current Injection (BCI) Method
Part 4. Bulkcurrentinjection (BCI)
[ISO 11452-4..2005, Roadvehicles-Componenttestmethodsforelectrical
Part 4. Bulkcurrentinjection (BCI), MOD]
2016-10-13 release.2017-11-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People 's Republic of China
China National Standardization Management Committee released
Preface
GB/T 33014 "Road vehicles electrical/electronic components of narrow-band radiation electromagnetic energy immunity test method" includes the following parts.
- Part 1. General provisions;
Part 2. Anechoic chamber method;
- Part 3. transverse electromagnetic wave (TEM) chamber method;
- Part 4. High current injection (BCI) method;
- Part 5. Stripe line method;
- Part 7. Radio frequency (RF) power direct injection method;
- Part 8. Magnetic field immunity method;
- Part 9. Portable transmitter simulation;
Part 10. Conduction immunity method for extended audio range;
Part 11. Reverberation chamber method.
This part is part 4 of GB/T 33014.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part uses the re-drafting method to modify the use of ISO 11452-4..2005 "road vehicles narrowband radiation electromagnetic energy caused by electrical harassment
Part test methods - Part 4. High current injection (BCI) method.
The technical differences between this section and ISO 11452-4..2005 are as follows.
- the preparation of Chapter 1 in accordance with GB/T 1.1-2009;
--- ISO 11452-1 referenced by the original international standard is changed to GB/T 33014.1 with ISO 11452-1;
- the original international standard 7.2 in the artificial network using Appendix C, this part to its content equivalent to GB/T 33014.2-2016
In Appendix A, to avoid duplication of the same content and the original international standards are not completely unified;
- The remote/proximal grounding in the original International Standard 7.2 is in Appendix D, and this part is changed to its equivalent GB/T 33014.2-2016
In Appendix B, to avoid duplication of the same content and the original international standards are not fully unified;
- in the normative reference documents to increase GB/T 33014.2-2016;
In order to achieve consistency with the understanding and presentation of Part 1, I, II, III, IV, and V of Table C.1 (Original E.1) are changed to
L1, L2, etc., I, Ⅱ, Ⅲ, etc. understood as the state Ⅰ, Ⅱ, Ⅲ and so on.
The following editorial changes have been made in this section.
--- deleted the original international standard preface and introduction.
- delete Appendix C and Appendix D of the original International Standard, this section changes Appendix E of the original International Standard to Appendix C;
This part is made by the Ministry of Industry and Information Technology of the People's Republic of China.
This part is owned by the National Automobile Standardization Technical Committee (SAC/TC114).
This part of the drafting unit. China Automotive Technology Research Center, Shenzhen City Hang Sheng Electronics Co., Ltd., China Testing Technology Co., Ltd. limited
Company, Shanghai Automotive Group Passenger Car Company, Suzhou Tai Site Electronic Technology Co., Ltd., China Electronic Technology Standardization Institute, Shanghai Volkswagen
Automobile Co., Ltd., Changchun Automobile Testing Center, Shenzhen BYD Automobile Co., Ltd., BMW (China) Automobile Trading Co., Ltd., Denso
(China) Investment Limited.
This part of the main drafters. Xu Xiuxiang, Ding Yifu, Wang Xibin, Li Yunhong, Ma Qian, Sun Chengming, Cui Qiang, Liu Xinliang, Lin Yanping,
Zhou Xuguang, Zhang Yue, Zhu Yan.
Road vehicle electrical/electronic components for narrowband radiation
Electromagnetic energy immunity test method
Part 4. High Current Injection (BCI) Method
1 Scope
This part of GB/T 33014 specifies the anti-interference test method for electrical/electronic components for continuous narrowband radioactive harassment outside the vehicle.
Current injection (BCI) method.
This part applies to M, N, O, L vehicles (not limited to vehicle power systems such as spark ignition engines, diesel engines, electric
Machine) with electrical/electronic components.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, the only dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 33014.1 Road vehicles - Test methods for the immunity of electrical/electronic components to narrowband radiated electromagnetic energy - Part 1.
(GB/T 33014.1-2016, ISO 11452-1..2005, MOD)
GB/T 33014.2-2016 Road vehicles - Test methods for the immunity of electrical/electronic components to narrowband radiated electromagnetic energy - Part 2
Sectional. Anechoic chamber method (ISO 11452-2..2004, MOD)
3 terms and definitions
GB/T 33014.1 Definitions of terms and definitions apply to this document.
4 test conditions
The frequency range for the high current injection (BCI) method is a direct function of the current probe characteristics, ranging from 1MHz to 400MHz. Required electricity
Flow probe is more than one type.
The user should specify the severity of the test within the frequency range, the recommended test severity level see Appendix C.
The following standard test conditions shall comply with the provisions of GB/T 33014.1.
--- test temperature;
--- test voltage;
--- Modulation;
Stay time
The frequency step
--- the definition of the harsh rating;
--- test signal quality.
5 test sites
The test shall be carried out in a shielded room.
6 Test equipment and instruments
6.1 Overview
The high current injection (BCI) method is a method of using a current injection probe to directly couple a disturbance signal to a harness for performing a immunity test.
law. The injection probe is a current transformer, through which the harness of the DUT is passed. By changing the severity of the test and sensing the harassment
Frequency of the anti-interference test.
6.2 Test equipment and equipment
6.2.1 Current injection probe (probe group). The test device output signal coupled to the DUT, regardless of the system load size, should cover the whole band,
The probe set can receive continuous input power in the full range.
6.2.2 Current measurement probe (probe group). should cover the whole band.
6.2.3 Artificial Network (AN). See 7.2.
6.2.4 Radio frequency (RF) signal generator. with internal or external modulation capabilities.
6.2.5 Power amplifier.
6.2.6 Power meter (or equivalent measuring instrument). used to measure the forward power and reflected power.
6.2.7 Current measuring equipment.
6.3 DUT excitation and monitoring equipment
The drive should be operated as far as possible using the DUT to reduce the influence of electromagnetic properties. Such as plastic button, plastic pipe pneumatic device.
Devices that monitor DUT's electromagnetic interference characteristics can use fiber or high-impedance wires, or other types of electrical
Line, but to minimize the interaction between the wires. The direction, length and position of the wires should be recorded to ensure that the test results are reusable
Reality.
Avoid any electrical connection between the monitoring device and the DUT may cause malfunction of the DUT.
7 test arrangement
7.1 ground plate
The ground plate shall be of at least 0.5 mm thick copper, brass or galvanized steel. The minimum width is 1000mm and the minimum length is
2000mm, or.200mm larger than the sides of the entire equipment, whichever is larger.
The height of the ground plate (test bed) shall be on the ground (900 ± 100) mm, and the grounding plate shall be electrically connected to the shield case and grounded
The distance between the copper strip shall not be greater than 300mm, the DC resistance shall not exceed 2.5mΩ.
7.2 Power and Artificial Network (AN)
Each DUT's power cord should be connected to the power supply via AN.
Usually the power supply is connected to the negative pole of the power supply. If the power supply used by the DUT is the positive ground, the test arrangement shown in Fig. 1 and Fig. 2 needs to be
Line corresponding adjustment. The power supply is connected to the DUT via a 5μH/50Ω AN (see Appendix A of GB/T 33014.2-2016). Required AN
The number of DUT in accordance with the installation of the vehicle to determine.
--- DUT remote grounding (vehicle power supply circuit is greater than.200mm). to use two AN, one of which connected to the power positive, the other then
Power supply line (see Appendix B of GB/T 33014.2-2016).
--- DUT proximal grounding (vehicle power supply line does not exceed.200 mm). use an AN, use the positive power supply (see
Appendix B of GB/T 33014.2-2016).
AN should be installed directly on the ground plate, the shell should be overlapped with the ground plate. The power return line should be connected to the ground plate (in the power supply and
AN). The measurement port of each AN should be 50Ω load.
7.3 Location of the DUT
The DUT should be placed on the insulation support (εr ≤ 1.4) above the ground plate (50 ± 5) mm. DUT's housing should not be used with
Grounding plate connected (except for the actual vehicle structure). The DUT surface is at least 100 mm from the ground plate edge.
In addition to placing the grounding plate of the DUT, the DUT and any other metal parts (such as walls of the shielded room) are at least 500mm apart.
7.4 Test the position of the harness
Unless otherwise specified in the test plan, the total length of the test harness between the DUT and the load simulator (or RF boundary) shall be (1000 ±
10) mm. The wiring harness type should be determined according to the actual system requirements. The test harness should be placed on an insulating bracket on a ground plate
Square (50 ± 5) mm position.
The test harness should be placed in a straight line and has a fixed structure (the position and number of wires). The wiring harness should be injected through the current into the probe and current
Measuring probe. The wire connecting the load simulator should be fixed and its length should be shorter than the test harness.
7.5 Load the position of the simulator
It is best to place the load simulator directly on the ground plate. Such as the load simulator for the metal shell, the shell and the ground plate directly lap.
Such as DUT leads to the test harness through the RF interface and ground plate lap, the load simulator can be placed near the ground plate (shell and
Ground plate lap) or outside the laboratory.
If the load simulator is placed on a grounded plate, the DC power cord of the load simulator should be connected via AN.
7.6 Current probe position
7.6.1 Alternative method
The distance between the injection probe and the DUT connector should be.
--- d (see Figure 1) = (150 ± 10) mm;
--- d = (450 ± 10) mm;
--- d = (750 ± 10) mm.
If a current measuring probe is used in the test, it should be located at the DUT connector (50 ± 10) mm.
7.6.2 Closed-loop method for limiting power
The current injection probe should be placed from the UT connector (900 ± 10) mm and the current measurement probe should be placed from the DUT connector (50 ±
10) mm.
Alternative method (8.3.1) Example of test arrangement See Figure 1, closed-loop method for limiting power (8.3.2) An example of a test arrangement is shown in Fig.
The unit is in millimeters
Description.
1 --- DUT (if necessary can be near ground); 7 --- fiber;
2 --- test harness; 8 --- high frequency equipment;
3 --- load simulator; 9 --- injection probe;
4 --- excitation and monitoring system; 10 --- grounding plate;
5 --- power supply; 11 --- insulation bracket;
6 --- artificial network (AN); 12 --- shielded shell.
Note. This test current measurement probe is optional, not shown in the figure.
A top view.
B side view.
Figure 1 BCI test arrangement --- alternative method
The unit is in millimeters
Description.
1 --- DUT (if necessary to be near ground); 6 --- artificial network (AN); 11 --- ground plate;
2 --- test harness; 7 --- fiber; 12 --- insulation bracket;
3 --- load simulator (position and grounding see see 7.5); 8 --- high-frequency equipment; 13 --- shielded shell.
4 --- excitation and monitoring system; 9 --- current measurement probe;
5 --- power supply; 10 --- injection probe;
A top view.
B side view.
Figure 2 BCI test arrangement - closed-loop method for limiting power
8 Test method
8.1 Overview
The overall layout of harassment sources and connecting harnesses represents the test conditions of the specification, and if the length of the harness and the length of the standard test harness and other items
The presence of the deviation, to be recognized before the test, and recorded in the test report.
The DUT shall be terminated with a typical load and the other operating conditions shall be in accordance with its conditions on the vehicle. These working conditions should be in the pilot program
So that the supplier and the customer to carry out exactly the same test.
8.2 Experimental Plan
A pilot plan should be developed prior to conducting the test, including the following.
--- test arrangement;
---experiment method;
---Frequency Range;
--- DUT operation mode;
--- DUT acceptance criteria;
--- test harsh rating;
--- DUT monitoring conditions;
The position of the probe;
- injection pattern with multiple connector harnesses;
--- the contents of the test report;
- other special instructions and differences in relative standard tests.
Each DUT should be tested under the most typical conditions, ie at least in standby mode and all functions of the DUT are in the operating mode
experimenting.
8.3 test
8.3.1 alternative method
8.3.1.1 Overview
Alternative methods use forward power as a reference for calibration and testing. In two phases.
A) calibration (using fixture);
B) test.
8.3.1.2 Calibration
The specified test level (current) should be calibrated on a regular basis (see Appendix A), at the time of calibration, at each test frequency,
To produce the required forward current for the specified current. Should be calibrated using a non-modulated sine wave.
If required, forward power and reflected power should be recorded in the calibration report of the test report.
One end of the calibration fixture is connected to a 50Ω load (high power) and the other end is connected to a 50Ω RF power meter and connected to the corresponding 50Ω
Attenuator to protect the power meter (see Appendix A).
8.3.1.3 testing
Install the DUT, harness and related equipment on the test bench as shown in Figure 1. According to the pre-determined calibration value in the test plan
DUT Apply test signal.
A current measurement probe is available between the current injection probe and the DUT. When the measured system is improved, the current measurement probe can be a test strip
Changes in the situation and the cause of the problem of research work to provide the necessary information. It should be noted that the measurement probe may affect the injection current.
8.3.2 Closed-loop method for limiting power
8.3.2.1 Overview
The closed-loop method uses forward power as a reference for calibration and testing. In two phases.
A) calibration (using fixture);
B) test.
Use the calibration fixture to determine the power limit. Use the power limit-frequency curve to determine the harassment applied to the DUT.
8.3.2.2 Calibration
Used to determine the power limit for the DUT test. The specified test level (current) shall be calibrated prior to actual testing (see Appendix A)
The forward power required to generate the specified current at each test frequency on the 50Ω calibration fixture is determined.
The unmodulated sine wave should be used for calibration. One end of the calibration fixture is connected to a 50Ω load (high power) and the other end is connected to a 50Ω RF
Power meter, and in series with the corresponding power of 50Ω attenuator to protect the power meter. Apply a test signal level to the fixture and record the corresponding forward
power.
If required, forward power and reflected power should be recorded in the calibration report of the test report.
Calculate the power limit see equation (1).
PCWlimit = kPforcal (1)
Where.
PCWlimit --- power limit;
Pforcal --- test fixture to achieve the required current when the forward power;
K - the default value is 4 (except for the test plan).
8.3.2.3 testing
Install the DUT, cable and related equipment on the test bench as shown in Figure 2. Each frequency point test process is as follows.
Increase the forward power applied to the current injection probe and measure the injection current (Iref) until the measured current reaches the specified test level,
Or the forward power reaches the power limit.
In both cases, the injection current (Iref) and the applied forward power (Pref) should be recorded. When the sensitivity limit of the DUT is found, it fails
Current (Ifault) and applied forward power (Pfault) are also recorded.
When the harness used contains several branches, use the injection probe to hold each branch for repeated testing, and the probe is connected to the DUT
(900 ± 10) mm. In this test case, the position of the current measurement probe from the DUT remains the same.
8.4 Test Report
In accordance with the requirements of the test plan, the test report shall contain the following information. test equipment, test area, measured system, frequency, power level
System interaction and other test related information.
The closed-loop method for limiting the power shall include the following additional information in the test report.
- values of Iref, Pref, Ifault, Pfault, and PCWlimit;
--- the transfer impedance of the test bench (the voltage injected by the current injection probe divided by the current measured by the current measurement probe)
See Appendix B for a test or calculation method.
Appendix A
(Normative appendix)
Calibration of Current Injection Probes
An example of a device configuration for determining the injection current using a calibration fixture for calibration of the current injection probe is shown in Figure A.1.
The injection probe is mounted in the center of the calibration fixture (see Figure A.2), which is scanned within the test frequency range and the forward power is measured
DUT test current.
Description.
1 --- shielded room;
2 --- 50Ω coaxial load (voltage standing wave ratio VSWR ≤ 1.2. 1);
3 --- calibration fixture;
4 --- injection probe;
5 --- 50Ω attenuator;
6 - spectrum analyzer or equivalent equipment;
7 --- RF power meter (requires two);
8 - RF50Ω dual directional coupler (minimum decoupling factor 30dB);
9 --- output impedance of 50Ω broadband amplifier;
10 --- RF signal generator.
Figure A.1 Schematic diagram of the device configuration
Description.
1 --- insulation bracket; 4 --- termination 50Ω measuring equipment;
2 --- removable metal cover; 5 --- termination 50Ω load.
3 - current injection probe;
Note. The physical dimensions of the calibration fixture should be consistent with the requirements of the injection probe manufacturer.
Figure A.2 Example of calibration fixture
Appendix B
(Normative appendix)
The transfer impedance of the test bench
B.1 Overview
The transfer impedance is used to describe the characteristics of the wiring harness, DUT and load composition system, independent of the injection probe and the current measurement probe. Use turn
The shift resistance makes it easier to compare tests in different laboratories or using different test harnesses. The transfer impedance Zt of the test bench is defined as.
Zt =
Uind
Iind
(B.1)
Where.
Uind --- current injection probe in the wiring harness induced common mode voltage;
Iind --- measured point-induced common-mode current.
The transfer impedance can be measured using the network analyzer described in B.2 or by the B.3 method.
B.2 Transfer impedance measurement (using network analyzer)
B.2.1 Definition of parameter relations
See Figure B.1.
Description.
1 --- S parameter four-terminal network.
Figure B.1 Transfer impedance measurement
For known S-parameter four-port networks, the incident and reflected waves are defined as follows.
For port 1.
A1 =
U1 ZcI1
2 Zc
(B.2)
B1 =
U1-ZcI1
2 Zc
(B.3)
Where.
A1 --- incident wave;
B1 --- reflected wave;
U1 --- current injection probe in the wiring harness induced common mode voltage;
I1 --- measured point-induced common-mode current;
Zc --- characteristic impedance (Zc = 50Ω).
For port 2.
A2 =
U2 ZcI2
2 Zc
(B.4)
B2 =
U2-ZcI2
2 Zc
(B.5)
Where.
A2 --- incident wave;
B2 --- reflected wave;
U2 --- current injection probe in the wiring harness induced common mode voltage;
I2 --- measured point induced common mode current;
Zc --- characteristic impedance (Zc = 50Ω).
From the physical incident wave and reflected wave in the four-port network performance for the input and output power. The relationship between the incident wave and the reflected wave is expressed by S
The parameters are expressed as.
B1 = S11a1 S12a2 and b2 = S21a1 S22a2 (B.6)
When the network output terminates at 50Ω load.
A2 = 0, b1 = S11a1 and b2 = S21a1 (B.7)
Where.
S11 --- reflection coefficient;
S21 --- transmission coefficient of four-terminal network.
B.2.2 Calibration current injection probe
See Figure B.2.
Description.
1 --- network analyzer;
2 --- port 1;
3 --- port 2;
4 --- current injection probe;
5 --- 50Ω load;
6 --- calibration fixture.
Figure B.2 Calibration current injection probe
According to the definition of current injection probe insertion loss IL can be calculated by the formula (B.8).
IL2 =
B22
A21
= S221, inject (B.8)
Where.
IL2 --- current insertion probe power insertion loss;
B22 --- calibration fixture port induction power;
A21 --- current input into the probe input power;
S221, inject --- the power transfer coefficient of the current injection probe.
It can also be concluded that.
IL (dB) = S21, inject (dB) (B.9)
Current injection probe on the calibration fixture induction voltage Uind, fixture 50Ω load voltage for each Uind/2, which.
B22 =
50 =
Uind
(B.10)
From (B.8) and (B.10) available.
Uind
A1 =
2 50IL (B.11)
B.2.3 Current measurement probe calibration
See Figure B.3.
Description.
1 --- network analyzer;
2 --- port 1;
3 --- port 2;
4 --- current measurement probe;
5 --- 50Ω load;
6 --- calibration fixture.
Figure B.3 Current measurement probe calibration
Using the transfer impedance Zt to describe the current measurement probe characteristics, the formula is as follows.
Zt, probe =
Urtnd
Iind
(B.12)
Where.
Urtnd - the feedback voltage from the current measuring probe that terminates the 50Ω load;
Iind --- measured current.
B22 =
U2rtnd
(B.13)
A21 = 50I2ind (B.14)
By (B12) and (B.13) available.
B2
Iind =
Zt, probe
(B.15)
From (B.14) and (B.15) available.
Zt, probe = 50
B2
A1 =
50S21, read (B.16)
B.2.4 Transfer impedance measurement
See Figure B.4.
Description.
1 --- network analyzer;
2 --- port 1;
3 --- port 2;
4 --- current injection probe;
5 --- current measurement probe;
6 --- DUT;
7 --- terminate the load of the AN.
Figure B.4 Transfer impedance measurement
The transfer impedance Zt is defined by equation (B.17)
Zt =
Uind
Iind =
Uind
A1 ×
A1
B2 ×
B2
Iind
(B.17)
From the equations (B.11) and (B.16), the transfer impedance of the test bench can be calculated according to the S21 measurements and probe characteristics in Figure B.4 according to formula (B.18)
Calculate.
Zt =
2Zt, probeIL
S21
(B.18)
Or according to formula (B.19) calculation.
Zt (dBΩ) = 6 Zt, probe (dBΩ) IL (dB) -S21 (dB)
(B.19)
The IL (dB) in equation (B.19) is negative.
B.3 transfer impedance calculation
The transfer impedance Zt can also be calculated from the measured values of the calibration and test. The calibration fixture transfer impedance is 100Ω, which is calculated
Type.
Zt = 100
Ical
Iind
Pdir
Pcal
(B.20)
Where.
Ical --- calibration current;
Iind --- measuring current;
Pcal - the current used to calibrate the current injected into the probe;
Pdir --- the current used to test the current injected into the probe.
Or according to formula (B.21) calculation.
Zt (dBΩ) = 40 Ical (dBmA) -Iind (dBmA) Pdir (dBm) -Pcal (dBm) (B.21)
Appendix C
(Informative)
Function Execution Status Classification (FPSC)
Recommended test harsh grades and frequency bands are shown in Table C.1 and Table C.2.
Table C.1 Recommended Test Severity
Test harsh rating
Test level
MA
L1 25
L2 50
L3 75
L4 100
Negotiated
Table C.2 Band
Band
Frequency Range
MHz
F1 1 ≤ f ≤ 10
F2 10 \u003cf≤30
F3 30 \u003cf≤80
F4 80 \u003cf≤200
F5.200 \u003cf≤400
Note. For details of FPSC, see GB/T 33014.1.
......
|