GB/T 17626.5-2019 PDF English
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Electromagnetic compatibility - Testing and measurement techniques - Surge immunity test
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| GB/T 17626.5-2008 | English | 140 |
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Electromagnetic compatibility -- Testing and measurement techniques -- Surge immunity test
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Electromagnetic compatibility--Testing and measurement techniques--Surge immunity test
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GB/T 17626.5-2019: Electromagnetic compatibility - Testing and measurement techniques - Surge immunity test
---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT17626.5-2019
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 33.100.20
L 06
GB/T 17626.5-2019 / IEC 61000-4-5.2014
Replacing GB/T 17626.5-2008
Electromagnetic compatibility - Testing and
measurement techniques - Surge immunity test
[IEC 61000-4-5.2014, Electromagnetic compatibility (EMC) - Part 4-5.Testing
and measurement techniques - Surge immunity test, IDT]
Issued on: JUNE 04, 2019
Implemented on: JANUARY 01, 2020
Issued by. State Administration for Market Regulation;
Standardization Administration of the PRC.
Table of Contents
Foreword... 3
1 Scope... 7
2 Normative references... 8
3 Terms, definitions and abbreviations... 8
4 General... 14
5 Test levels... 15
6 Test instrumentation... 16
7 Test setup... 34
8 Test procedure... 39
9 Evaluation of test results... 41
10 Test report... 41
Annex A (Normative) Surge testing for unshielded outdoor symmetrical
communication lines intended to interconnect to widely dispersed systems.. 43
Annex B (Informative) Selection of generators and test levels... 51
Annex C (Informative) Explanatory notes... 54
Annex D (Informative) Considerations for achieving immunity for equipment
connected to low voltage power distribution systems... 59
Annex E (Informative) Mathematical modelling of surge waveforms... 61
Annex F (Informative) Measurement uncertainty (MU) considerations... 71
Annex G (Informative) Method of calibration of impulse measuring systems 82
Annex H (Informative) Coupling/decoupling surges to lines rated above 200 A
... 86
Bibliography... 88
Foreword
GB/T 17626 "Electromagnetic compatibility - Testing and measurement
techniques'' is divided into the following parts.
- Part 1.Overview of immunity tests;
- Part 2.Electrostatic discharge immunity test;
- Part 3.Radiated, radio-frequency, electromagnetic field immunity test;
- Part 4.Electrical fast transient/burst immunity test;
- Part 5.Surge immunity test;
- Part 6.Immunity to conducted disturbances, induced by radio-frequency
fields;
- Part 7.General guide on harmonics and interharmonics measurements and
instrumentation, for power supply systems and equipment connected
thereto;
- Part 8.Power frequency magnetic field immunity test;
- Part 9.Pulse magnetic field immunity test;
- Part 10.Damped oscillatory magnetic field immunity test;
- Part 11.Voltage dips, short interruptions and voltage variations immunity
tests;
- Part 12.Ring wave immunity test;
- Part 13.Harmonics and interharmonics including mains signalling at a.c.
power port low frequency immunity test;
- Part 14.Voltage fluctuation immunity test;
- Part 15.Flickermeter - Functional and design specifications;
- Part 16.Test for immunity to conducted, common mode disturbances in the
frequency range 0 Hz to 150 kHz;
- Part 17.Ripple on d.c. input power port immunity test;
- Part 18.Damped oscillatory wave immunity test;
- Part 20.Emission and immunity testing in transverse electromagnetic (TEM)
waveguide;
- Part 21.Reverberation chamber test methods;
- Part 22.Radiated emissions and immunity measurements in fully anechoic
rooms (FARs);
- Part 24.Test methods for protective devices for HEMP conducted
disturbance;
- Part 27.Unbalance immunity test;
- Part 28.Variation of power frequency immunity test;
- Part 29.Voltage dips short interruptions and voltage variations on d.c. input
power port immunity tests;
- Part 30.Power quality measurement methods;
- Part 34.Voltage dips, short interruptions and voltage variations immunity
tests for equipment with mains current more than 16 A per phase.
This Part is Part 5 of GB/T 17626.
This Part is drafted in accordance with the rules given in GB/T 1.1-2009.
This Part replaces GB/T 17626.5-2008 "Electromagnetic compatibility - Testing
and measurement techniques - Surge immunity test". Compared with GB/T
17626.5-2008, the main technical changes are as follows.
- Delete some references (see Clause 2; Clause 2 of the 2008 edition);
- ADD 3 new definitions (see 3.1.6, 3.1.11, and 3.1.15) and modify 2
definitions (see 3.1.8, 3.1.14; 3.7, 3.15 of the 2008 edition);
- ADD abbreviations (see 3.2);
- ADD line-to-line and line-to-ground test levels (see Table 1; Table 1 of the
2008 edition);
- Modify the definitions of the waveform parameters 1.2/50 μs-8/20 μs (see
Table 2; Table 2 of the 2008 edition);
- ADD description of calibration method for generator characteristics (see
6.2.3);
- Delete the description of 10/700 μs combination wave generator (see
Clause 6; 6.2 of the 2008 edition);
- Modified the flowchart for selection of the coupling/decoupling network (see
Figure 4; 6.3 of the 2008 edition);
- Modify the requirements for CDN for a.c./d.c. power supply; ADD the
relationship between peak open-circuit voltage and peak short-circuit
current of the CDN's EUT port (see 6.3.2; 6.3.1 of the 2008 edition);
- ADD calibration for CDN (see 6.4);
- Delete description of test setup for high-speed communication lines (see
Clause 7; 7.5 of the 2008 edition);
- Delete description of test setup for applied potential difference (see Clause
7; 7.7 of the 2008 edition);
- Delete description of the operating condition of the EUT (see Clause 7; 7.8
of the 2008 edition);
- ADD special instructions for surge tests of ports connected to external
communication cables. In particular, specify the technical parameters of the
10/700 μs combination wave generator (see Annex A; 6.2 of the 2008
edition);
- ADD mathematical modelling of surge waveforms (see Annex E);
- ADD measurement uncertainty considerations (see Annex F);
- ADD method of calibration of impulse measuring systems (see Annex G);
- ADD coupling/decoupling surges to lines rated above 200 A (see Annex H).
This Part, using the translation method, is identical to IEC 61000-4-5.2014
"Electromagnetic compatibility (EMC) - Part 4-5.Testing and measurement
techniques - Surge immunity test".
China’s documents which have a consistent correspondence with the
international documents normatively referenced in this Part are as follows.
- GB/T 2900 (all parts) Electrotechnical terminology [IEC 60050 (all parts)].
The following editorial changes have been made in this Part.
- CHANGE the standard name to "Electromagnetic compatibility - Testing
and measurement techniques - Surge immunity test";
- Amend the "open-circuit" in footnote a of Table 5 to "short-circuit";
- Amend the "line L2-to-line L3" in the title of Figure 7 to "line L3-to-line L2";
- Amend the connection point of the combination wave generator to the
coupling network in Figure 9, Figure 10, and Figure A.4;
- Amend "as described in 7.6.2 and Figure 12" in 7.1 to "as described in 7.6
and Figure 12";
- Amend "Tw" in Figure E.2 to "T";
- Amend the "A reasonable estimate of α can be obtained as the arithmetic
mean between the minimum... that appear in Table 1" in F.4.6 to "A
reasonable estimate of α can be obtained as the arithmetic mean between
the minimum... that appear in Table F.4";
- Amend "V′(tp)=0" in F.4.7 to "V′in(tp)=0".
This Part was proposed by and shall be under the jurisdiction of National
Technical Committee 246 on Electromagnetic Compatibility of Standardization
Administration of China (SAC/TC 246).
Drafting organizations of this Part. China Electronics Standardization Institute;
Suzhou 3ctest Electronic Co., Ltd.; Beijing Fuseq Co., Ltd.; National Institute of
Metrology, China; Lenovo (Beijing) Co., Ltd.; Shanghai Institute of
Measurement and Testing Technology; China Automotive Technology and
Research Center Co., Ltd.
Main drafters of this Part. Li Huanran, Zhang Qiang, Lan Defu, Huang Pan, Lv
Feiyan, Zhao Wenhui, Ding Yifu, Huang Xuejun, Ye Chang, Hou Xinwei.
The previous editions of the standard replaced by this Part were released as
follows.
- GB/T 17626.5-1999, GB/T 17626.5-2008.
1 Scope
This Part of GB/T 17626 relates to the immunity requirements, test methods,
and range of recommended test levels for equipment with regard to
unidirectional surges caused by over-voltages from switching and lightning
transients. Several test levels are defined which relate to different environment
and installation conditions. These requirements are developed for and are
applicable to electrical and electronic equipment.
2 Normative references
The following documents are indispensable for the application of this document.
For the dated references, only the editions with the dates indicated are
applicable to this document. For the undated references, the latest edition
(including all the amendments) are applicable to this document.
IEC 60050 (all parts) International electrotechnical vocabulary
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050
as well as the following apply.
3.1.1
Avalanche device
Diode, gas tube arrestor, or other component that is designed to break down
and conduct at a specified voltage.
4 General
4.1 Power system switching transients
Power system switching transients can be separated into transients associated with.
4.2 Lightning transients
The rapid change of voltage and flow of current which can occur as a result of
the operation of a lightning protection device can induce electromagnetic
disturbances into adjacent equipment.
5 Test levels
For selection of the test levels for the different interfaces, refer to Annex B.
6 Test instrumentation
6.1 General
Two types of combination wave generators are specified. Each has its own
particular applications, depending on the type of port to be tested.
6.2 Combination wave generator
6.2.1 General
It is the intention that the output waveforms meet specifications at the point
where they are to be applied to the EUT.
7 Test setup
7.1 Test equipment
The following equipment is part of the test setup.
- equipment under test (EUT);
- auxiliary equipment (AE) when required.
7.2 Verification of the test instrumentation
The purpose of verification is to ensure that the test setup is operating correctly.
8 Test procedure
8.1 General
The test procedure includes.
- the verification of the test instrumentation according to 7.2;
- the establishment of the laboratory reference conditions.
8.2 Laboratory reference conditions
8.2.1 Climatic conditions
Tests shall not be performed if the relative humidity is so high as to cause
condensation on the EUT or the test equipment.
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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