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GB/T 17626.4-2018 (GBT17626.4-2018)

GB/T 17626.4-2018_English: PDF (GBT 17626.4-2018, GBT17626.4-2018)
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BASIC DATA
Standard ID GB/T 17626.4-2018 (GB/T17626.4-2018)
Description (Translated English) Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L06
Classification of International Standard 33.100.20
Word Count Estimation 34,399
Date of Issue 2018-06-07
Date of Implementation 2019-01-01
Drafting Organization Shanghai Industrial Automation Instrumentation Research Institute Co., Ltd., Shanghai Institute of Metrology and Testing Technology, China Electric Power Research Institute Co., Ltd., Shanghai Instrumentation Automation System Inspection and Testing Institute Co., Ltd.
Administrative Organization National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC 246)
Proposing organization National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC 246)
Issuing agency(ies) State Administration of Markets and China National Standardization Administration

Standards related to: GB/T 17626.4-2018

GB/T 17626.4-2018
Electromagnetic compatibility--Testing and measurement techniques--Electrical fast transient/burst immunity test
ICS 33.100.20
L06
National Standards of People's Republic of China
Replace GB/T 17626.4-2008
Electromagnetic compatibility test and measurement technology
Electrical fast transient burst immunity test
[IEC 61000-4-4.2012, Electromagneticcompatibility (EMC)-
Part 4-4. Testingandmeasurementtechniques-
Electricalfasttransient/burstimmunitytest, IDT]
2018-06-07 released.2019-01-01 implementation
State market supervision and administration
China National Standardization Administration issued
Content
Foreword I
1 range 1
2 Normative references 1
3 Terms and definitions, abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 3
4 Overview 3
5 Test level 4
6 Test equipment 4
6.1 Overview 4
6.2 Pulse group generator 4
6.3 AC/DC Power Port Coupling/Decoupling Network 7
6.4 Capacitive coupling clip 9
7 Test arrangement 11
7.1 Overview 11
7.2 Test equipment 11
7.3 Test arrangement for laboratory type tests 13
7.4 Test setup for field trials 16
8 Test procedure 18
8.1 Overview 18
8.2 Laboratory Reference Conditions 18
8.3 Conducting the test 19
9 Evaluation of test results 19
10 Test report 19
Appendix A (informative) Information on electrical fast transients 21
Appendix B (informative) Selection of test grades 23
Appendix C (informative) Considerations for measurement uncertainty 24
Reference 31
Foreword
GB/T 17626 "Electromagnetic Compatibility Test and Measurement Technology" currently includes the following parts.
---GB/T 17626.1-2006 Electromagnetic compatibility test and measurement technology immunity test;
---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test;
---GB/T 17626.3-2016 Electromagnetic compatibility test and measurement technology RF electromagnetic field radiation immunity test;
---GB/T 17626.5-2008 Electromagnetic compatibility test and measurement technology surge (impact) immunity test;
---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Conducted disturbance immunity of RF field induction;
---GB/T 17626.7-2008 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic wave measurement
Guidance for quantity and measuring instruments;
---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology power frequency magnetic field immunity test;
---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test;
---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology damping magnetic field immunity test;
---GB/T 17626.11-2008 Electromagnetic compatibility test and measurement technology resistance to voltage dips, short interruptions and voltage changes
Disturbance test
---GB/T 17626.12-2013 Electromagnetic compatibility test and measurement technology ringing wave immunity test;
---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and grid letters
Low frequency immunity test;
---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology voltage fluctuation immunity test;
---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications;
---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity
test;
---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test;
---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology damping oscillatory wave immunity test;
---GB/T 17626.20-2014 Electromagnetic Compatibility Test and Measurement Technology Emission and Immunity in Transverse Electromagnetic Wave (TEM) Waveguides
Degree test
---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;
---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiation emission and immunity in full anechoic chamber
measuring;
---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device
method;
---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology three-phase voltage unbalance immunity test;
---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology power frequency change immunity test;
---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term
Immunity test for breaking and voltage changes;
---GB/T 17626.30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method;
---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology for main power supply per phase current greater than 16A
Voltage dip, short interruption and voltage variation immunity test.
This part is the fourth part of GB/T 17626.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part replaces GB/T 17626.4-2008 "Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test".
Compared with GB/T 17626.4-2008, the main technical changes are as follows.
--- Removed the reference standard IEC 60050-300..2001, International Electrotechnical Vocabulary Electrical and Electronic Measurement and Measurement Instruments 311
Part. General terms relating to measurement; Part 312. General terms relating to electrical measurements; Part 313. Electrical measurements
Type of gauge; Section 314. Specific terms based on gauge type (see Chapter 2);
---Added 1 term and definition (see 3.1.1);
--- Added abbreviations (see 3.2);
--- Removed the main components of the test generator (see 6.2.1);
--- Increased the calculation formula of Figure 3 and the ideal waveform (see 6.2.2);
--- Removed the "single pulse waveform of Figure 3 connected to 50Ω load", adding the "single pulse of Figure 3 output to 50Ω load
Think of the waveform (see Figure 3 of 6.2.2)";
--- Added the calibration content of the 6.4.2 capacitive coupling clip, adding Figure 7, Figure 8 (see 6.4.2);
--- Added 7.2.2 test instrument verification (see 7.2.2);
--- Add the label after the capacitive coupling clip in Figure 11 (see Figure 11);
--- Modified the test arrangement of the top entry device, added Figure 13 (see Figure 7.2.2 Figure 13);
--- Removed Figure 12, added Figure 15 (see Figure 7.4.2 Figure 15);
--- Added Appendix C information on measurement uncertainty (see Appendix C);
--- Removed 1 of Table C.1 and Table C.2 of Appendix C (see Appendix C, Table C.1 and Table C.2);
--- Revised Appendix C Table C.1 where A is α and in Appendix C there is no A (see Appendix C, Table C.1).
This section uses the translation method equivalent to IEC 61000-4-4.2012 Electromagnetic Compatibility (EMC) Part 4-4. Test and Measurement Techniques
Electrical fast transient burst immunity test.
This section has made the following editorial changes.
--- In line with the existing standard series, change the name of this part to "Electromagnetic Compatibility Test and Measurement Technology Electric Fast Transient Burst Group
Immunity test.
This part is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246).
This section drafted by. Shanghai Industrial Automation Instrumentation Research Institute Co., Ltd., Shanghai Institute of Metrology and Testing Technology, China Electric Power Division
Research Institute Co., Ltd., Shanghai Instrumentation Automatic Control System Inspection and Testing Institute Co., Ltd.
The main drafters of this section. Wang Ying, Weng Haifeng, Yu Lei, Zhang Yixiang, Gong Zeng, Li Ni, Zhou Pengcheng, Fei Jie.
The previous versions of the standards replaced by this section are.
---GB/T 17626.4-1998, GB/T 17626.4-2008.
Electromagnetic compatibility test and measurement technology
Electrical fast transient burst immunity test
1 Scope
This part of GB/T 17626 deals with the immunity requirements and test methods for electrical and electronic equipment for repetitive electrical fast transients. this
In addition, the scope of the test level is specified and the test procedure is determined.
The purpose of this section is to evaluate the electrical power port, signal, control, and ground ports of electrical and electronic equipment during electrical fast transients.
The performance of the bursts determines a common basis for the reproducibility of the assessment. The test methods specified in this section describe an evaluation device or system.
A consistent method for the consistency of defined phenomena.
Note. As described in IEC Guide 107, this section is the basic EMC standard for use by product committees. IEC Guideline 107 also specifies that the Product Committee
The committee is responsible for determining whether or not to apply this immunity test standard. If used, it is responsible for determining the appropriate test level and performance criteria. National Electromagnetics
The Standardization Technical Committee and its subcommittees are willing to work with the Product Committee to evaluate the specific immunity requirements of their products.
This section specifies.
---Test voltage waveform;
---The scope of the test level;
---Test equipment;
--- Calibration and verification procedures for test equipment;
---Test arrangement;
--- Test procedure.
This section gives technical specifications for testing in the laboratory and in the field.
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article.
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
GB/T 4365-2003 Electrotechnical terminology electromagnetic compatibility [IEC 60050 (161)..1990, IDT]
3 terms and definitions, abbreviations
3.1 Terms and definitions
The following terms and definitions as defined in GB/T 4365-2003 apply to this document.
3.1.1
Auxiliary equipment auxiliaryequipment; AE
A device that provides the required signals for the normal operation of the device under test (EUT) and a device that verifies EUT performance.
3.1.2
Burst burst
A limited number of clearly identifiable pulse sequences or oscillations of limited duration.
[GB/T 4365-2003, definition 2.2]
3.1.3
Calibration calibration
A set of operations that establish a relationship between the labeled value and the measured result by reference standard under the specified conditions with reference to the standard.
Note 1. This term is used in the “uncertainty” method.
Note 2. In principle, the relationship between the marked value and the measured result can be represented by a calibration chart.
[GB/T 2900.77-2008, definition 311-01-09]
3.1.4
Coupling coupling
The interaction between lines transfers energy from one line to another.
3.1.5
Common mode (coupling) commonmode(coupling)
It is also coupled to all conductors to the ground reference plane.
3.1.6
Coupling clamp couplingclamp
a predetermined size that couples the disturbance signal to the test line in a common mode without any electrical connection to the line under test.
And a feature of the equipment.
3.1.7
Coupling network couplingnetwork
A circuit used to transfer energy from one line to another.
3.1.8
Decoupling network decouplingnetwork
An electrical fast transient voltage applied to prevent application to the device under test from affecting other circuits, devices, or systems that are not tested.
3.1.9
(performance) degradation (ofperformance)
Undesirable deviations in performance between a device, device, or system from normal performance.
Note. The term "lowering" can be used for temporary or permanent failure.
[GB/T 4365-2003, definition 2.1]
3.1.10
EFT/Belectricalfasttransient/burst
Electrical fast transient bursts.
3.1.11
Electromagnetic compatibility electromagneticcompatibility; EMC
A device or system that works properly in its electromagnetic environment and does not constitute an unacceptable electromagnetic disturbance to anything in the environment.
ability.
[GB/T 4365-2003, definition 2.1]
3.1.12
EUTequipmentundertest
Test equipment.
3.1.13
Ground reference plane groundreferenceplane
A conductive plane whose potential is used as a common reference potential.
[GB/T 4365-2003, definition 2.4]
3.1.14
Immunity (toadisturbance)
The ability of a device, device, or system to experience electromagnetic disturbances without degrading operational performance.
[GB/T 4365-2003, definition 2.1]
3.1.15
Port port
A special interface between the device under test and the external electromagnetic environment.
3.1.16
Pulse width pulsewidth
The time interval when the instantaneous value reaches 50% of the rising edge of the first pulse and 50% of the last falling edge is reached.
Note. Rewrite IEC 60050 (702)..2001, definition 702-03-04
3.1.17
Rise time risetime
The time it takes for the pulse instantaneous value to rise from 10% of the pulse amplitude to 90% for the first time.
[GB/T 4365-2003, definition 2.2]
3.1.18
Transient transient
A physical quantity or physical phenomenon that changes between two adjacent stable states whose change time is less than the time scale of interest.
[GB/T 4365-2003, definition 2.2]
3.1.19
Asymmetric mode (coupling) unsymmetricmode(coupling)
Single line coupling with respect to the ground reference plane.
3.1.20
Verification verification
Used to inspect test equipment systems (eg, test generators and interconnecting cables) to demonstrate a complete set of operations for the test system to function properly.
Note 1. The method of verification may be different from the calibration method.
Note 2. For the purposes of this basic EMC standard, this definition differs from the definition given in IEV311-01-13.
3.2 Abbreviations
The following abbreviations apply to this document.
AE Auxiliary Equipment (AuxiliaryEquipment)
CDN Coupling/Decoupling Network
EFT/B Electrical Fast Transient Burst (ElectricalFastTransient/Burst)
EMC Electromagnetic Compatibility (ElectroMagneticCompatibility)
ESD Electrostatic Discharge (ElectroStaticDischarge)
EUT device under test (EquipmentUnderTest)
GRP ground reference plane (GroundReferencePlane)
MU measurement uncertainty (MeasurementUncertainty)
PE protective grounding (ProtectiveEarth)
TnL nonlinear terminal (TerminatornonLinearity)
4 Overview
Repetitive fast transient test is a method of coupling a pulse group consisting of many fast transient pulses to the power supply of electrical and electronic equipment.
Test of port, control port, signal port and ground port. The main points of the test are high amplitude of transients, short rise time, high repetition rate and low energy.
See Appendix A for quantities.
This test is to verify electrical and electronic equipment such as from switching transients (cutting inductive loads, relay contact bounces, etc.)
The immunity of various types of transient disturbances.
5 test level
Table 1 lists the priority for electrical fast transient testing of the device's power, control, signal, and ground ports.
Test level used.
Table 1 Test level
Open circuit output test voltage and pulse repetition frequency
grade
Power port and ground port (PE) signal port and control port
Voltage peak
kV
repeat frequency
kHz
Voltage peak
kV
repeat frequency
kHz
1 0.5 5 or 100 0.25 5 or 100
2 1 5 or 100 0.5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
Xa specific to a specific specific
A repetition rate of 5 kHz is conventionally used; however, 100 kHz is closer to the actual situation. The product standardization technical committee should decide with a specific product or
Those frequencies associated with the product type.
For some products, there is no clear distinction between the power port and the signal port. In this case, it should be tested by the Product Standardization Technical Committee.
The purpose is to determine how to proceed.
a “X” can be of any grade and should be specified in the special equipment specification.
See Appendix B for the selection of test levels.
6 test equipment
6.1 Overview
6.2.3, 6.3.2 and 6.4.2 calibration procedures ensure test generators, coupling/decoupling networks and other units that constitute the test arrangement
Proper operation so that the expected waveform is applied to the device under test.
6.2 Pulse group generator
6.2.1 Overview
A schematic diagram of the generator is given in Figure 1. The generator is opened and connected via selected circuit components Cc, Rs, Rm and Cd
A fast transient occurs under a 50Ω resistive load condition. The effective output impedance of the signal generator should be 50Ω.
element.
U --- high voltage source;
Rc --- charging resistor;
Cc --- storage capacitors;
Rs --- pulse duration adjustment resistor;
Rm --- impedance matching resistor;
Cd --- DC blocking capacitor;
Switch---high voltage switch.
Note. Switching characteristics and distribution (inductance and capacitance) have an effect on rise time.
Figure 1 Schematic diagram of the main components of the fast transient burst generator
6.2.2 Fast transient burst generator characteristics
The characteristics of the fast transient burst generator are as follows.
---1000Ω load output voltage range at least from 0.24kV~3.8kV;
The output voltage range is -0.125kV~2kV at -50Ω load.
The generator should be able to operate under short circuit conditions without being damaged.
characteristic.
---Polarity. Positive polarity, negative polarity
--- Output type. coaxial output, 50Ω
--- DC blocking capacitor. (10 ± 2) nF
---Repetition frequency. (See Table 2) Repeat frequency value × (1 ± 20%) kHz
--- Relationship with AC power. Asynchronous
---Burst duration. (15 ± 3) ms at 5kHz
(See Figure 2) (0.75 ± 0.15) ms at 100kHz
---Burst period. (300 ± 60) ms
(See Figure 2)
---Pulse waveform
● Output to 50Ω load rise time tr=(5±1.5) ns
Pulse width tw = (50 ± 15) ns
Peak voltage. according to the voltage value of Table 2 × (1 ± 10%)
(The waveform of the 50Ω load is shown in Figure 3.)
● Output to 1000Ω load rise time tr=(5±1.5) ns
Pulse width tw=50ns, allowing deviation from -15ns to 100ns
Peak voltage. according to the voltage value of Table 2 × (1 ± 20%)
(See Note 1 of Table 2)
Figure 2 Electrical fast transient pulse group overview
Figure 3 Ideal waveform of a single pulse output to a 50Ω load (tr=5ns, tw=50ns)
Figure 3 is the calculation formula for the ideal waveform vEFT(t).
vEFT(t)=kv
V1
kEFT×
Τ1
nEFT
1 tτ1
nEFT×e
Τ2
In the formula.
kEFT=e-
Τ1
Τ2×
nEFT×τ2
Τ1( )
nEFT
Kv---maximum or peak value of open circuit voltage (kv=1 means normalized voltage)
V1=0.92 τ1=3.5ns τ2=51ns nEFT=1.8
Note. This formula is given in Appendix B of IEC 62305-1.2010.
6.2.3 Calibration of electrical fast transient burst generator characteristics
In order to establish a common reference for all generators, the test generator characteristics should be calibrated (see Appendix C for uncertainty regarding calibration).
Therefore, the following procedure should be taken.
The output of the test generator is connected to a 50Ω and 1000Ω coaxial terminal, respectively, and the voltage is monitored by an oscilloscope. Oscilloscope
The -3dB bandwidth should be at least 400MHz. The test load impedance for 1000 Ω may be a composite network.
The test load impedance characteristics are as follows.
---(50±1) Ω;
---(1000±20) Ω; measure resistance under DC.
The insertion loss tolerance of the two test loads shall not exceed.
● Less than or equal to 100MHz. ±1dB;
● 100MHz~400MHz. ±3dB.
The following parameters should be measured.
● Peak voltage.
For each set voltage in Table 2, measure the output voltage [Vp(50Ω)] when connected to a 50Ω load, and the measured voltage value should be
Vp (50Ω), tolerance is ±10%;
For the same generator setting (set voltage), measure the voltage [Vp (1000Ω)] when connected to 1000Ω load, and measure the voltage value.
It should be Vp (1000Ω) with a tolerance of ±20%.
● The rise time of all set voltages.
● Pulse width of all set voltages.
● The pulse repetition frequency of any set voltage within a burst.
● The burst duration of any set voltage.
● The burst period of any set voltage.
Table 2 Output voltage peak and repetition frequency
Setting voltage
kV
Vp (open circuit)
kV
Vp (1000Ω)
kV
Vp (50Ω)
kV
repeat frequency
kHz
0.25 0.25 0.24 0.125 5 or 100
0.5 0.5 0.48 0.25 5 or 100
1 1 0.95 0.5 5 or 100
2 2 1.9 1 5 or 100
4 4 3.8 2 5 or 100
Measures should be taken to ensure that parasitic capacitance is kept to a minimum.
Note 1. As shown in the Vp (1000Ω) column, a 1000Ω load impedance will automatically cause the voltage reading to be less than 5% of the set voltage. Vp when connected to 1000Ω load
The reading is equal to Vp (open circuit) multiplied by a multiple of 1000/1050 (test load vs. line impedance 1000 Ω plus 50 Ω ratio).
Note 2. When connected to a 50Ω load, as shown above, the measured output voltage is 0.5 times the voltage at no load.
6.3 AC/DC Power Port Coupling/Decoupling Network
6.3.1 Coupling/Decoupling Network Characteristics
The coupling/decoupling network is used for the testing of AC/DC power ports.
The circuit diagram (taking a three-phase power supply as an example) is given in Figure 4.
Typical coupling/decoupling network characteristics are as follows.
--- Ferrite decoupling inductance> 100μH;
---Coupling capacitor 33nF.
element.
L1, L2, L3---phase line;
N --- midline;
PE --- protective grounding;
Cc --- coupling capacitor.
Figure 4 Coupling/decoupling network for AC/DC power port/terminal
6.3.2 Coupling/decoupling network characteristic calibration
The measurement equipment given in 6.2.3 is also applied to the calibration of the coupling/decoupling network characteristics.
The coupling/decoupling network should be calibrated using a generator that meets the requirements of 6.2.3 (see Appendix C for uncertainty regarding calibration).
The waveform should be calibrated in common mode coupling, ie, transient pulses are simultaneously coupled to all lines. For each coupling line, it should be coupled/decoupled
Each output (L1, L2, L3, N and PE) of the network is connected to a 50Ω terminal to calibrate the waveform separately from the reference ground. Figure 5 shows five calibrations
One of the measurements, L1, is calibrated to the reference ground.
Note 1. Each coupling line is separately verified to ensure that each line functions properly and is calibrated.
Note that the output of the CDN should be connected using a coaxial adapter.
The connection between the output of the CDN and the coaxial adapter should be as short as possible, no more than 0.1m.
Set the generator's output voltage to a nominal value of 4kV and then calibrate. The generator is connected to the input of the coupling/decoupling network.
Each output of the coupling/decoupling network (usually connected to the EUT) is terminated in turn with a 50Ω load, and the other outputs are open. Record each
Peak voltage and waveform of polarity.
The rise time of the pulse should be (5.5 ± 1.5) ns.
The pulse width should be (45 ± 15) ns.
According to Table 2, the peak voltage should be (2 ± 0.2) kV.
Note 2. The values shown above are the result of the CDN calibration method.
Disconnect the device under test from the power supply network. The generator is set at 4kV. The coupling/decoupling network is set in common mode coupling, ie, the transient is changed.
The pulse is coupled to all lines simultaneously, and each input terminal (L1, L2, L3, N to PE) is terminated at 50Ω, respectively, in the coupling/decoupling network
The residual voltage measured at the source input should not exceed 400V.
Figure 5 Waveform calibration at the output of the coupling/decoupling network
6.4 Capacitive coupling clip
6.4.1 Overview
The coupling clip can be used without any electrical connection to the terminal of the device under test, the cable shield or any other part of the device under test.
The electrical fast transient burst is coupled to the test line.
The coupling capacitance of the coupling clip depends on the cable diameter, material and shielding, if any.
The device consists of a splint covering the cable of the test line (flat or round) (for example made of galvanized steel, brass, copper or aluminum) and
It should be placed on the ground reference plane. The perimeter of the ground reference plane should be at least 0.1 m beyond the coupling clip.
Both ends of the coupling clip should have a high voltage coaxial connector, either of which can be connected to the test generator. The generator should be connected to the coupling clip
The end closest to the device under test.
When the coupling clip has only one high voltage coaxial connector, the high voltage coaxial connector end should be closest to the device under test.
The coupling clip itself should be closed as much as possible to provide the maximum coupling capacitance between the cable and the coupling clip.
Figure 6 shows the mechanical structure of the coupling clip. The following dimensions should be used.
--- bottom coupling plate height. (100 ± 5) mm;
--- bottom coupling plate width. (140 ± 7) mm;
--- Bottom coupling plate length. (1000 ± 50) mm.
The coupling of the coupling clips is required for the test of the connecting wires on the signal and control ports. Only when 6.3 is defined coupling/decoupling
When the network is not applicable, the coupling of the coupling clip can also be used for the test of the power port (see 7.3.2.1).
The unit is mm
±5% tolerance for all dimensions
Figure 6 capacitive coupling clip structure
6.4.2 Calibration of capacitive coupling clips
The measurement equipment given in 6.2.3 is also used for the calibration of the capacitive coupling clamp characteristics.
A sensing board (Figure 7) should be inserted into the coupling clip and connected to the measuring terminal or attenuator with a low inductance grounded connection adapter.
The arrangement is shown in Figure 8.
The unit is mm
Figure 7 Sensor board for coupling clip calibration
The induction plate is a piece of metal with a size of 120mm × 1050mm and a thickness of 0.5mm. The positive and negative media are 0.5mm thick.
Board insulation. In order to avoid contact between the coupling clip and the sensor board, the insulation of all sides of the sensor board should be at least 2.5kV. One end passes the longest
Connect to the adapter for a 30mm long low impedance connection. The sensor board should be placed in the capacitive coupling clip, and the connection end should be coupled to the bottom coupling board side.
Edge alignment. The connection adapter should be connected to the ground plane via a low impedance for a 50Ω coaxial measurement terminal or attenuator ground. Sensor board and
The distance between the 50Ω measuring terminal or the attenuator should not exceed 0.1m.
Note. The gap between the upper coupling plate and the sensing plate is not important.
The calibration waveform should use a separate 50Ω termination.
The capacitive coupling clamp should be calibrated using a generator that meets the requirements of 6.2.2 and 6.2.3.
The generator output voltage is set to 2kV when calibrating.
Figure 8 Using a sensor board to calibrate the capacitive coupling clip
The generator is connected to the capacitive coupling clip input.
Record the peak voltage and waveform parameters of the sensor board at the other end of the coupling clip.
The waveform characteristics should meet the following requirements.
● rise time (5 ± 1.5) ns;
● Pulse width (50 ± 15) ns;
● Peak voltage (1000±200)V.
7 test arrangement
7.1 Overview
Define different types of tests based on the test environment.
--- Type (conformity) test conducted in the laboratory;
--- On-site testing of the equipment under the final installation conditions of the equipment.
Type testing in the laboratory is preferred.
The equipment to be tested shall be arranged in accordance with the manufacturer's installation instructions (if applicable).
7.2 Test equipment
7.2.1 Overview
The test setup includes the following equipment (see Figure 9).
--- Ground reference plane;
---Coupling device (coupling network or coupling clip);
--- (if applicable) decoupling network;
--- Test generator.
Figure 9 Block diagram of electrical fast transient burst immunity test
7.2.2 Test instrument verification
The purpose of the verification is to ensure that the electrical fast transient burst test setup is properly performed between calibrations. Electrical fast transient burst test setup
include.
---Electric fast transient pulse group generator;
---Coupling decoupling network;
---Capacitive coupling clip;
--- Interconnect cable.
In order to verify that the system is functioning correctly, the following signals should be checked.
--- Electrical fast transient burst signal at the CDN output;
--- Electrical fast transient burst signal of capacitive coupling clip.
The system is not connected to the EUT and the transient bursts are verified at any level using a suitable measuring device (such as an oscilloscope) (see Figure 2).
The lab can specify an internal control reference for this verification program.
An example of a verification procedure for a capacitive coupling ...
...