GB/T 17473: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 17473-2025 | English | RFQ |
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3 days [Need to translate]
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(Performance test method for electronic pastes - Conductor pastes test)
| Valid |
GB/T 17473-2025
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| GB/T 17473.1-2008 | English | 70 |
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Test methods of precious metals pastes used for microelectronics -- Determination of solids content
| Valid |
GB/T 17473.1-2008
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| GB/T 17473.1-1998 | English | 199 |
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2 days [Need to translate]
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Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
| Obsolete |
GB/T 17473.1-1998
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Basic data | Standard ID | GB/T 17473-2025 (GB/T17473-2025) | | Description (Translated English) | (Performance test method for electronic pastes - Conductor pastes test) | | Sector / Industry | National Standard (Recommended) | | Date of Implementation | 2026-05-01 | | Older Standard (superseded by this standard) | GB/T 17473.1-2008, GB/T 17473.2-2008, GB/T 17473.3-2008, GB/T 17473.4-2008, GB/T 17473.5-2008, GB/T 17473.6-2008, GB/T 17473.7-2022 | | Issuing agency(ies) | State Administration for Market Regulation; Standardization Administration of China | GB/T 17473.1-2008: Test methods of precious metals pastes used for microelectronics -- Determination of solids content
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test methods of precious metals pastes used for microelectronics - Determination of solids content
ICS 77.120.99
H68
National Standards of People's Republic of China
GB/T 17473.1-2008
Replace GB/T 17473.1-1998
Precious metal paste test method for microelectronics technology
Solid content determination
2008-0331 released
2008-09-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
Issued by the National Standardization Administration of China
Precious metal paste test method for microelectronics technology
Solid content determination
1 Scope
This section specifies the test method for the solid content in the precious metal slurry for microelectronics technology.
This section applies to the determination of the solid content of precious metal pastes for various sintered and solidified microelectronics technologies.
2 Reference documents
The clauses in the following documents have become clauses of this part after being quoted in this part. For dated reference documents, all subsequent
Amendments (not including errata content) or revisions do not apply to this section. However, all parties who have reached an agreement based on this section are encouraged to study
Is the latest version of these files available? For undated reference documents, the latest version is applicable to this section.
GB/T 8170 Numerical rounding rules
3 Principles of the method
The precious metal slurry is heated at a certain temperature for a certain period of time, and its solid content is determined according to the quality difference before and after heating.
4 Instruments and equipment
4.1 Balance. Sensitivity is 0.0001g.
4.2 Box-type resistance furnace. the highest operating temperature is 1,000°C, and the temperature control accuracy is ±20°C.
4.3 Blast-type constant temperature oven. the highest operating temperature is 300°C, and the temperature control accuracy is ±5°C.
4.4 Dryer. Color-changing silica gel is used as a desiccant.
5 Sample
Stir the sample evenly without introducing impurities.
6 Test steps
Experimental environment. ambient temperature 15℃～35℃, relative humidity 45%～75%, atmospheric pressure 86kPa～106kPa.
6.1 Sample
6.1.1 Sintered slurry. Weigh three 1g samples, accurate to 0.0001g, and place them in a 2ml porcelain crucible of constant weight.
6.1.2 Curing paste. Weigh three samples of 0.2g～0.3g, accurate to 0.0001g, and place them on the polyester PET film.
Spread out appropriately.
6.2 Experimental temperature and operation
6.2.1 Sintered slurry. Place the crucible with the sample in the box-type resistance furnace, slightly open the furnace door, heat up to 150°C, and keep the temperature for 30 minutes. close
Put on the furnace door, continue to heat up to 850 ℃, keep warm for 30 min. After sintering, turn off the power, open the furnace door and cool to 80℃～100℃, take out the crucible
The crucible is placed in a desiccator, cooled to room temperature, and weighed.
6.2.2 Curing type slurry. Place the polyester PET film loaded with the sample in a blast-type constant temperature oven, heat it to the curing temperature of the slurry, and keep it warm.
After 60 minutes, take out the film, put it in a desiccator to cool to room temperature, and weigh it.
7 Calculation of test results
7.1 Calculated according to formula (1), the mass fraction of solids in the slurry is, and the value is expressed in %.
GB/T 17473.1-2008
100 (1)
Where.
---The mass fraction of solids in the slurry, %;
7.2 The test results are expressed to two decimal places, and the mantissa of the significant digits shall be carried out in accordance with the rules of GB/T 8170 value rounding.
7.3 Take the arithmetic average of the test results of three samples as the measurement result.
7.4 The difference between the absolute values of the three samples tested with each other is not more than 1% of the average value. The measurement result is valid, otherwise another sample is taken and the measurement is repeated.
8 Test report
The test report should include the following.
a) Sample number;
b) Sample name, brand and specification;
c) Product batch number;
d) Test results and the seal of the inspection department;
e) Number of this standard;
f) Tester and test date.
GB/T 17473.1-2008
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