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Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
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GB/T 15651.6-2023
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| Standard ID | GB/T 15651.6-2023 (GB/T15651.6-2023) | | Description (Translated English) | Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L53 | | Classification of International Standard | 31.080.99 | | Word Count Estimation | 87,845 | | Date of Issue | 2023-09-07 | | Date of Implementation | 2024-04-01 | | Drafting Organization | The Thirteenth Research Institute of China Electronics Technology Group Corporation, National Semiconductor Device Quality Inspection and Testing Center, China Electronics Technology Standardization Institute, Shenzhen Institute of Standards and Technology, Jingneng Optoelectronics (Jiangxi) Co., Ltd., Shandong Inspur Huaguang Optoelectronics Co., Ltd. , Hongli Zhihui Group Co., Ltd., South China University of Technology, Fujian Hongbo Optoelectronics Technology Co., Ltd., Guangzhou Saixi Standard Testing Research Institute Co., Ltd., Beijing Jichuang North Technology Co., Ltd., Hebei Zhongdian Kehang Testing Technology Services Co., Ltd. company | | Administrative Organization | Ministry of Industry and Information Technology of the People's Republic of China (Electronics) | | Proposing organization | Ministry of Industry and Information Technology of the People's Republic of China | | Issuing agency(ies) | State Administration for Market Regulation, National Standardization Administration |
GB/T 15651.6-2023. Semiconductor devices Part 5-6. Optoelectronic devices Light-emitting diodes
ICS 31.080.99
CCSL53
National Standards of People's Republic of China
Semiconductor Devices Part 5-6.
Optoelectronic devices light emitting diodes
(IEC 60747-5-6.2021,IDT)
Published on 2023-09-07
2024-04-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration Committee
Table of contents
Preface V
Introduction VI
1 range 1
2 Normative reference documents 1
3 Terms and definitions, abbreviations 2
3.1 General terms and definitions 2
3.2 Terms and definitions related to radiation dose testing 5
3.3 Terms and definitions related to photometric testing 7
3.4 Terms and definitions related to thermal parameter testing 10
3.5 Abbreviations 11
4 Absolute maximum ratings 11
5 Optoelectronic properties 12
6 Test Method 14
6.1 Basic requirements 14
6.2 Forward voltage (VF) test 16
6.3 Reverse voltage (VR) test 18
6.4 Internal resistance (rf) test 18
6.5 Reverse Current (IR) Test 20
6.6 Inter-terminal capacitance (Ct) test 20
6.7 Junction temperature (Tj) and thermal resistance (Rth(jX)el, Rth(jX)real) test 22
6.8 Response time test 28
6.9 Frequency response and cutoff frequency (fc) test 30
6.10 Luminous flux (Φv) test 32
6.11 Radiant flux (Φe) test 33
6.12 Luminous intensity (IV) test 35
6.13 Radiation intensity (Ie) test 37
6.14 Brightness (LV) test 38
6.15 Emission spectral distribution, peak emission wavelength (λp), spectral half-width (Δλ) test 39
6.16 Chromaticity coordinate test 40
6.17 Directional characteristics and half intensity angle test 42
6.18 Illuminance (EV) test 44
7 Packaging marking45
8 Quality Assessment 45
8.1 General 45
8.2 Quality Assessment Category 45
8.3 Appraisal and inspection 51
8.4 Batch-by-batch inspection 52
8.5 Periodic inspection 52
8.6 Relaxation of batch-by-batch inspection procedures52
8.7 Maintenance of accreditation qualifications52
8.8 Long-term storage of products53
8.9 Electrical durability test 53
Appendix A (Normative) Standard optical efficiency 55
Appendix B (normative) Self-absorption correction factor 59
Appendix C (Normative) Color Correction Factor 61
Appendix D (normative) Calibration of luminance meter 63
Appendix E (Normative) Color Matching Function of XYZ Standard Colorimetric System 64
Appendix F (normative) Spectral chromaticity coordinates 71
Appendix G (normative) Light meter calibration 78
Reference 79
Figure 1 Radiation intensity 6
Figure 2 Radiant brightness 6
Figure 3 Radiation Exit Degree 7
Figure 4 Radiation (radiation) illumination 7
Figure 5 Spectral optical efficiency 8
Figure 6 Forward voltage VF test circuit diagram 16
Figure 7 Circuit diagram for testing VF using constant voltage source and current limiting resistor17
Figure 8 Circuit diagram for testing VF with SMU17
Figure 9 VR test circuit diagram 18
Figure 10 RF test circuit Figure 19
Figure 11 IR test circuit 20
Figure 12 Ct test circuit diagram 21
Figure 13 Ct test circuit diagram 22
Figure 14 Example of temperature dependence of ηPE23
Figure 15 Correlation between measured thermal resistance and heating duration24
Figure 16 Cumulative heat capacity and cumulative heat resistance characteristics (structure function) 24
Figure 17 VF change test circuit Figure 25
Figure 18 Changes in VF during the measurement process 26
Figure 19 Example of VF changes over time27
Figure 20 Transient oscillation waveform after heating is turned off27
Figure 21 Response time test circuit Figure 29
Figure 22 Response time test waveform 30
Figure 23 fc test circuit diagram 31
Figure 24 Φv test circuit diagram 32
Figure 25 Φe test circuit diagram 34
Figure 26 IV test circuit schematic 35
Figure 27 IV test circuit diagram 36
Figure 28 Ie test circuit diagram 37
Figure 29 LV test circuit diagram 38
Figure 30 λp test circuit diagram 39
Figure 31 λp test circuit diagram 39
Figure 32 Δλ test principle diagram 40
Figure 33 Chromaticity coordinate chart 41
Figure 34 Colorimetric test circuit diagram 43
Figure 35 Directional characteristics (Example 1) 43
Figure 36 Directional characteristics (example 2) 44
Figure 37 EV test circuit diagram 44
Figure 38 Electrical endurance test circuit diagram 53
Figure B.1 Principle of self-absorption test 59
Figure D.1 Principle of luminance meter calibration 63
Figure G.1 Illuminance meter calibration principle diagram 78
Table 1 Absolute Maximum Ratings11
Table 2 Optoelectronic characteristics 12
Table 3 CIE average LED intensity test 36
Table 4 Screening test items and their conditions (reference) 46
Table 5 Appraisal Inspection 46
Table 6 Batch-by-batch inspection 48
Table 7 Periodic Inspection 50
Table A.1 Spectral light visual efficiency function V(λ) specified value for photopic vision 55
Table E.1 Color matching functions of the XYZ standard colorimetric system 64
Table F.1 Spectral chromaticity coordinates71
Preface
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents"
Drafting.
This document is Part 5-6 of GB/T 15651 "Semiconductor Devices". GB/T 15651 has published the following parts.
---Semiconductor devices, discrete devices and integrated circuits Part 5.Optoelectronic devices (GB/T 15651-1995);
--- Semiconductor discrete devices and integrated circuits Part 5-2.Basic ratings and characteristics of optoelectronic devices (GB/T 15651.2-
2003);
--- Semiconductor discrete devices and integrated circuits Part 5-3.Test methods for optoelectronic devices (GB/T 15651.3-2003);
---Semiconductor Devices Discrete Devices Part 5-4.Optoelectronic Devices Semiconductor Lasers (GB/T 15651.4-2017);
This document is equivalent to IEC 60747-5-6.2021 "Semiconductor Devices Part 5-6.Optoelectronic Devices Light-Emitting Diodes".
This document has made the following minimal editorial changes.
---Add footnotes g and h in Table 1, footnote 1 in Table 2, footnote j in Table 5, footnote m in Table 6, and footnote f in Table 7.
Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents.
This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This document is under the jurisdiction of the Ministry of Industry and Information Technology (Electronics) of the People's Republic of China.
This document was drafted by. China Electronics Technology Group Corporation Thirteenth Research Institute, National Semiconductor Device Quality Inspection and Testing Center, China
Electronic Technology Standardization Institute, Shenzhen Institute of Standards and Technology, Jingneng Optoelectronics (Jiangxi) Co., Ltd., Shandong Inspur Huaguang Optoelectronics Co., Ltd.
Co., Ltd., Hongli Zhihui Group Co., Ltd., South China University of Technology, Fujian Hongbo Optoelectronics Technology Co., Ltd., Guangzhou Saixi Standard Testing
Research Institute Co., Ltd., Beijing Jichuang North Technology Co., Ltd., and Hebei Zhongdian Kehang Testing Technology Service Co., Ltd.
The main drafters of this document. Liu Dongyue, Huang Jie, Zhao Min, Liu Xiujuan, Zhao Tao, Hu Yi, Wang Chengxin, Lu Tiangang, Li Zongtao, Chen Qingmei,
Wu Duxiong, Fan Lei, Ru Zhiqin, Zhao Lihong, Liu Fang, Li Changpu, Zhao Peng.
introduction
Parts 5-6 of the GB/T 15651 series are formulated to provide appropriate testing and evaluation of light-emitting diode products for general industrial applications.
basis.
Part 5 of the GB/T 15651 series is a series of standards for semiconductor optoelectronic devices, which mainly stipulates the overall requirements for optoelectronic devices.
Requirements, basic ratings and characteristics, test methods, semiconductor lasers, optocouplers, light emitting diodes, photodiodes and phototransistors, etc.
The technical requirements, quality assurance regulations and other contents of the device are planned to be composed of the following parts.
---Part 5.Optoelectronic devices. The purpose is to provide semiconductor light emitting devices, semiconductor photodetection devices, semiconductor photosensitive
Standards for semiconductor devices and classified devices related to components, internal working mechanisms and optical radiation.
---Part 5-2.Basic ratings and characteristics of optoelectronic devices. The purpose is to provide semiconductor optoelectronic emitting devices, semiconductor
Photodetector devices, semiconductor photosensitive devices, semiconductor devices that perform optical radiation work internally, and basic devices classified as optoelectronic devices
These ratings and characteristics are not applicable to fiber optic systems or subsystems.
---Part 5-3.Optoelectronic device testing methods. The purpose is to provide testing methods for optoelectronic devices for fiber optic systems or
Except for subsystems.
---Part 5-4.Optoelectronic devices semiconductor lasers. The purpose is to specify the basic ratings, characteristics and
Test Methods.
---Part 5-5.Optoelectronic devices optocoupler. The purpose is to define the terminology, basic ratings, characteristics,
Safety testing and measurement methods.
---Part 5-6.Optoelectronic devices light-emitting diodes. The purpose is to specify the terminology, ratings and characteristics, testing and testing of light-emitting diodes.
test methods and quality assessment methods.
---Part 5-7.Optoelectronic devices photodiodes and phototransistors. The purpose is to specify photodiodes and photocrystals
Pipe terminology, basic ratings and characteristics, and methods of measurement.
Semiconductor Devices Part 5-6.
Optoelectronic devices light emitting diodes
1 Scope
This document specifies the terminology, basic ratings and characteristics, test methods and quality evaluation of light emitting diodes (LEDs) for general industrial applications.
Determined, involving annunciators, controllers, sensors, etc.
This document does not cover LEDs for lighting.
LEDs are divided into the following five types.
a) LED devices;
b) LED flat light-emitting device;
c) LED digital display and alphanumeric display;
d) Dot matrix LED for display;
e) Infrared emitting diode (IRLED);
f) Ultraviolet emitting diode (UVLED).
This document covers LEDs with heat sinks or equivalent heat sink functions.
This document does not include integral LEDs and controls, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps.
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations
For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to
this document.
ISO 2859-1 Enumeration sampling inspection procedures Part 1.Lot-by-lot inspection sampling plan retrieved by acceptance quality limit (AQL) Sam-
limit(AQL)forlot-by-lotinspection)
Note. GB/T 2828.1-2012 Enumeration sampling inspection procedures Part 1.Batch-by-batch inspection sampling plan (ISO
2859-1.1999,IDT)
tingprocedures-Part 2-17.Tests-TestQ.Sealing)
IEC 60068-2-30 Environmental testing Part 2-30.Test method test Db alternating damp heat, cycle (12h 12h cycle)
IEC 60747-5-13 Semiconductor devices Part 5-13.Hydrogen sulfide corrosion test for LED packages of optoelectronic devices (Semicon-
IEC 60749-10 Mechanical and climatic test methods for semiconductor devices Part 10.Mechanical shock (Semiconductor
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