GB/T 15651.5-2024_English: PDF (GB/T15651.5-2024)
Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
GB/T 15651.5-2024 | English | 1014 |
Add to Cart
|
7 days [Need to translate]
|
Semiconductor devices -- Part 5-5: Optoelectronic devices -- Photocouplers
| Valid |
GB/T 15651.5-2024
|
Standard ID | GB/T 15651.5-2024 (GB/T15651.5-2024) | Description (Translated English) | Semiconductor devices -- Part 5-5: Optoelectronic devices -- Photocouplers | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | L50 | Classification of International Standard | 31.080 | Word Count Estimation | 50,552 | Date of Issue | 2024-03-15 | Date of Implementation | 2024-07-01 | Drafting Organization | China Electronics Technology Standardization Institute, China Electronics Technology Group Corporation 44th Research Institute, Weikai Testing Technology Co., Ltd., China Electronics Technology Group Corporation 13th Research Institute, State Grid Jiangsu Electric Power Co., Ltd. | Administrative Organization | Ministry of Industry and Information Technology of the People's Republic of China | Proposing organization | Ministry of Industry and Information Technology of the People's Republic of China | Issuing agency(ies) | State Administration for Market Regulation, National Standardization Administration |
GB/T 15651.5-2024.Semiconductor devices Part 5-5.Optoelectronic devices Optocouplers
ICS 31.080
CCSL50
National Standards of People's Republic of China
Semiconductor devices Part 5-5.
Optoelectronic Devices Photocouplers
(IEC 60747-5-5.2020,IDT)
Released on 2024-03-15
2024-07-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface III
Introduction IV
1 Range 1
2 Normative references 1
3 Terms and Definitions 2
4 Electrical Characteristics 9
4.1 Phototransistor output type photocoupler 9
4.2 Photobidirectional thyristor output type photocoupler or solid-state photorelay 10
5 Optocoupler with electric shock protection function 11
5.1 Overview 11
5.2 Type 11
5.3 Rating 11
5.4 Electrical safety requirements 12
5.5 Electrical, environmental and/or durability test information (supplementary information) 13
6 Test methods for photocouplers 19
6.1 Current transfer ratio HF (ctr) 19
6.2 Input-output capacitance CIO 20
6.3 Input-output isolation resistance (RIO) 20
6.4 Isolation test 21
6.5 Partial Discharge in Photocouplers 22
6.6 Photocoupler Collector-Emitter Saturation Voltage VCE(sat) 25
6.7 Switching time of optocoupler ton,toff 27
6.8 Peak off-state current IDRM 28
6.9 Peak on-state voltage VTM 30
6.10 DC shutdown current IBD 32
6.11 DC conduction voltage VT 33
6.12 Holding current IH 34
6.13 Turn-off voltage critical rise rate dV/dt 34
6.14 Input Trigger Current 36
6.15 Common Mode Transient Immunity (CMTI) Test Method for Optocouplers 37
7 Test method for electrical ratings of photo-operated bidirectional thyristor type couplers 39
7.1 Off-state repetitive peak voltage VDRM 39
7.2 Off-state DC voltage VBD 40
Appendix A (Normative) Input/Output Safety Test 41
A.1 Purpose 41
A.2 Test Circuit 41
A.3 Circuit Description 41
A.4 Notes 41
A.5 Test Step 41
A.6 Required conditions 41
References 42
Preface
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document is Part 5-5 of GB/T 15651.GB/T 15651 has been published in the following parts.
--- Semiconductor devices Discrete devices and integrated circuits Part 5.Optoelectronic devices (GB/T 15651-1995);
--- Semiconductor discrete devices and integrated circuits Part 5-2.Basic ratings and characteristics of optoelectronic devices (GB/T 15651.2-
2003);
--- Semiconductor discrete devices and integrated circuits Part 5-3.Test methods for optoelectronic devices (GB/T 15651.3-2003);
--- Semiconductor devices discrete devices Part 5-4.Optoelectronic devices semiconductor lasers (GB/T 15651.4-2017);
--- Semiconductor devices Part 5-6.Optoelectronic devices-Light emitting diodes (GB/T 15651.6-2023);
---Semiconductor devices Part 5-7.Optoelectronic devices-Photodiodes and phototransistors (GB/T 15651.7-2024).
This document is equivalent to IEC 60747-5-5.2020 "Semiconductor devices Part 5-5.Optoelectronic devices, optocouplers".
The following minimal editorial changes were made to this document.
--- The note content is deleted from the scope. The English translation of "optocoupler" and "photocoupler" into Chinese is both photoelectric coupler.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document is proposed and coordinated by the Ministry of Industry and Information Technology of the People's Republic of China.
This document was drafted by. China Electronics Technology Standardization Institute, China Electronics Technology Group Corporation 44th Institute, Weikai Testing
Technology Co., Ltd., the 13th Institute of China Electronics Technology Group Corporation, and State Grid Jiangsu Electric Power Co., Ltd.
The main drafters of this document are. Liu Xiujuan, Zhao Ying, Zhang Jianing, Cao Yong, Cui Bo, Gong Lei, Xu Xiaoyi, Liu Dongyue, Cheng Xianwen and Huo Fuguang.
introduction
Part 5-5 of the GB/T 15651 series was formulated to provide an appropriate basis for the testing and evaluation of optocoupler products.
Part 5 of the GB/T 15651 series is a series of standards for semiconductor optoelectronic devices, which mainly stipulates the overall requirements of optoelectronic devices.
Requirements, basic ratings and characteristics, test methods, semiconductor lasers, optocouplers, light-emitting diodes, photodiodes and phototransistors, etc.
The technical requirements, quality assurance regulations, etc. of the device are planned to be composed of the following parts.
--- Part 5.Optoelectronic devices. The purpose is to give semiconductor light emitting devices, semiconductor photodetector devices, semiconductor photosensitive
Standards for components, semiconductor devices and sub-type devices related to internal working mechanisms and optical radiation.
--- Part 5-2.Basic ratings and characteristics of optoelectronic devices. The purpose is to give semiconductor photoelectron emitting devices, semiconductor
Photoelectric detection devices, semiconductor photosensitive devices, semiconductor devices that work with internal light radiation, and basic devices classified as optoelectronic devices
These ratings and characteristics are not applicable to optical fiber systems or subsystems.
--- Part 5-3.Test methods for optoelectronic devices. The purpose is to provide test methods for optoelectronic devices for optical fiber systems or
Except for subsystems.
--- Part 5-4.Optoelectronic devices - semiconductor lasers. The purpose is to specify the basic ratings, characteristics and
Test Methods.
--- Part 5-5.Optoelectronic devices, optocouplers. The purpose is to specify the terminology, basic ratings, characteristics, installation and maintenance of optocouplers.
Full test and measurement methods.
--- Part 5-6.Optoelectronic devices light emitting diodes. The purpose is to specify the terms, ratings and characteristics, test
Testing methods and quality assessment methods.
--- Part 5-7.Optoelectronic devices, photodiodes and phototransistors. The purpose is to specify photodiodes and phototransistors
Nomenclature, basic ratings and properties of pipes and methods of measurement.
Semiconductor devices Part 5-5.
Optoelectronic Devices Photocouplers
1 Scope
This document specifies the basic ratings, characteristics, safety tests and test methods for optocouplers.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 2421-2020 Overview and Guidelines for Environmental Testing (IEC 60068-1.2013, IDT)
GB 4943.1-2022 Audio, video, information technology and communication technology equipment Part 1.Safety requirements (IEC 62368-1.
2018,MOD)
Note. There is no technical difference between the referenced content of GB 4943.1-2022 and the referenced content of IEC 62368-1.2018.
GB/T 16935.1-2023 Insulation coordination for equipment in low voltage systems Part 1.Principles, requirements and tests (IEC 60664-1.
2020, IDT)
Tests-TestA.Cold)
Tests-Test B.Dry heat)
Part 2-14.Tests-Test N. Change of temperature)
cedures-Part 2-17.Tests-TestQ.Sealing)
IEC 60068-2-20 Environmental testing Part 2-20.Test method Test T. Resistance of devices with terminals to soldering heat
IEC 60068-2-27 Environmental testing Part 2.Test method Test Ea and guidance. Shock
IEC 60068-2-30 Environmental testing for electric and electronic products Part 2.Test method Test Db Cyclic damp heat (12h 12h
IEC 60068-2-58 Environmental testing Part 2-58.Test method Test Td. Solderability of surface mounted components, metallization layers
devices(SMD)]
IEC 60068-2-78 Environmental testing Part 2.Test method Test Cab. Steady state damp heat test (Environmentaltes-
......
|