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GB/T 13166-2018 English PDF

GB/T 13166-2018 (GB/T13166-2018, GBT 13166-2018, GBT13166-2018)
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BASIC DATA
Standard ID GB/T 13166-2018 (GB/T13166-2018)
Description (Translated English) Design margin and abuse tests for electronic measuring instrument
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L85
Classification of International Standard 17.220
Word Count Estimation 10,136
Date of Issue 2018-06-07
Date of Implementation 2019-01-01
Drafting Organization Institute of Electronics Industry Standardization, Ministry of Industry and Information Technology, Suzhou Comprehensive Inspection and Testing Center for Quality and Technology Supervision, 41st Institute of China Electronics Technology Group Corporation
Administrative Organization National Electronic Measurement Instrument Standardization Technical Committee (SAC/TC 153)
Issuing agency(ies) State Market Supervision Administration, China National Standardization Administration

Standards related to: GB/T 13166-2018

GB/T 13166-2018
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 17.220
L 85
Replacing GB/T 13166-1991
Design Margin and Abuse Tests
for Electronic Measuring Instrument
ISSUED ON. JUNE 07, 2018
IMPLEMENTED ON. JANUARY 01, 2019
Issued by. State Administration for Market Regulation;
Standardization Administration of PRC.
Table of Contents
Foreword ... 3
1 Scope ... 5
2 Normative References ... 5
3 Terms and Definitions ... 6
4 Design Margin ... 6
5 Abuse ... 10
Appendix A (Informative) Example of Design Margin Test ... 13
Appendix B (Informative) Examples of Abuse and Preventive Measures ... 14
Foreword
This Standard was drafted as per the rules specified in GB/T 1.1-2009.
This Standard replaced GB/T 13166-1991 Design Margin and Abuse Tests for
Electronic Measuring Instruments.
Compared with GB/T 13166-1991, this Standard has the major technical changes as
follows besides the editorial modifications.
--- Delete Test Objective (see Clause 2 of Edition 1991);
--- Add Normative References (see Clause 2 of this Edition);
--- Delete Test Requirements (see Clause 3 of Edition 1991);
--- Add Terms and Definitions (see Clause 3 of this Edition);
--- Delete Program (see Clause 4 of Edition 1991);
--- Increase the three-level indicator of the instrument (see 4.1.1 of this Edition);
--- Increase the design margin contents of the instrument (see 4.1.2 of this Edition);
--- Increase the parameter and indicator determination of the instrument (see 4.1.3
of this Edition);
--- Increase the margin design solution of the instrument (see 4.2 of this Edition);
--- Increase the software engineering design (see 4.2.4 of this Edition);
--- Increase the design verification (see 4.3 of this Edition);
--- Increase the Abuse (see Clause 5 of this Edition);
--- Add informative appendixes of “Example of Design Margin Test” and “Examples
of Abuse and Preventive Measures” (see Appendix A and B of this Edition).
Please note some contents of this document may involve patents. The issuing
organization of this document shall not assume the responsibility to identify these
patents.
This Standard shall be under the jurisdiction of National Technical Committee for
Standardization of Electronic Measuring Instrument (SAC/TC 153).
Drafting organizations of this Standard. Institute of Electronic Industry Standardization
for Ministry of Industry and Information Technology; Comprehensive Inspection &
Design Margin and Abuse Tests
for Electronic Measuring Instrument
1 Scope
This Standard specifies the design margin and abuse test that shall be carried out
during the design of new electronic measuring instruments (hereinafter referred to as
instrument).
This Standard is applicable to the electronic measuring instruments in all
environmental groups.
2 Normative References
The following documents are essential to the application of this document. For the
dated documents, only the versions with the dates indicated are applicable to this
document; for the undated documents, only the latest version (including all the
amendments) are applicable to this document.
GB 4824 Industrial, Scientific and Medical (ISM) Radio-Frequency Equipment -
Electromagnetic Disturbance Characteristics - Limits and Methods of
Measurement
GB/T 6587 General Specification for Electronic Measuring Instruments
GB/T 17626.2 Electromagnetic Compatibility - Testing and Measurement
Techniques -Electrostatic Discharge Immunity Test
GB/T 17626.3 Electromagnetic Compatibility - Testing and Measurement
Techniques – Radiated, Radio-Frequency, Electromagnetic Field Immunity Test
GB/T 17626.4 Electromagnetic Compatibility - Testing and Measurement
Techniques -Electrical Fast Transient/Burst Immunity Test
GB/T 17626.6 Electromagnetic Compatibility - Testing and Measurement
Techniques - Immunity to Conducted Disturbances Induced by Radio-Frequency
Fields
4.2.1 Component derating design
Reduce the temperature stress and electrical stress that the component is subjected
to in the circuit. The optimal derating shall be at or below the area near the inflection
point of the reliability curve corresponding to the electrical stress and temperature
stress; determine the derating level according to the different applications of the
product. The derating shall not only consider the steady state, but also the transient
overload and dynamic electrical stress that may occur in the circuit.
4.2.2 Derating design for mechanical and structural components
Find the best match between stress and strength; obtain the expected design values;
so that the instrument can obtain best effects in the terms of weight, cost and material
availability when the instrument meets stress and strength requirements.
4.2.3 Environmental adaptability design
The environmental adaptability design shall meet the requirements of internal control
indicators from the developer, at least including high/low temperature design,
vibration/impact design, electromagnetic compatibility design.
4.2.4 Software engineering design
The developer shall carry out the software engineering design.
4.2.5 Redundant design
The redundancy shall be designed in the following cases.
a) When required by the user;
b) When the user does not require; but the reliability of the product is still not met
by other applied technologies (such as derating, simplifying the circuit, and
applying more reliable components, etc.).
4.3 Design verification
4.3.1 General
It is used for the early failure due to the defects of components, processes and design
or other causes; the instrument shall be tested repeatedly according to the margin
design requirements; so that obtain the working limit of the product, and discover the
potential weak links and components in the design phase. See Appendix A for
Examples of Design Margin Tests.
4.3.2 High/Low temperature test
the requirements of internal control indicators; while the electrostatic discharge
immunity test shall, according to the provisions of GB/T 17626.2, improve one test level
for each test till meets the requirements of internal control indicators.
5 Abuse
5.1 Identification and analysis of abuse
The abuse shall be predicted; identify and analyze the instrument performance
degradation, instrument damage or personal injury due to the human error. The
analytical procedures are as follows.
a) Record and analyze system failure; handle one failure at a time;
b) List and analyze the human operation relevant to each failure;
c) Classify and estimate the corresponding error probability.
5.2 Abuse type
The abuse type that may occur during the installation, use and handling of the
instrument; including missing necessary operating procedures, increasing the
redundant operating procedures, and reversing the operating sequence, etc. The
following are typical examples; but not limited to the following examples; thereof, a) ~
f) abuse type that may result from improper installation; g) ~ o) abuse type that may
occur due to improper use; p) ~ s) abuse type that may be caused by improper handling
and storage.
a) Work in a narrow space such as cabinet; there is no proper exhaust ventilation;
b) The input signal is inconsistent with the signal specified by the signal terminal;
c) The power supply is poorly grounded or the wiring is incorrect;
d) Access to the wrong power supply;
e) Fail to take the anti-static measures;
f) Wrong connection of cable or adapter;
g) The input signal power of the instrument input port is greater than the maximum
safe input power;
h) Input a large DC signal at the input and output port of the instrument;
i) Delete the exit-factory data file;
...