SJ/T 1147-1993 English PDF

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SJ/T 1147-1993: Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Status: Obsolete

SJ/T 1147: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
SJ/T 1147-1993	179	Add to Cart	2 days	Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors	Obsolete
SJ 1147-1977	RFQ	ASK	3 days	(Chinese Industry Standard)	Obsolete

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SJ/T 11634   GB/T 5593   GB/T 5597   SJ/T 1543   SJ/T 1542   SJ/T 3200   

Basic data

Standard ID: SJ/T 1147-1993 (SJ/T1147-1993)
Description (Translated English): Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Sector / Industry: Electronics Industry Standard (Recommended)
Classification of Chinese Standard: L90
Word Count Estimation: 3,319
Date of Issue: 12/17/1993
Date of Implementation: 6/1/1994
Older Standard (superseded by this standard): SJ 1147-1977
Quoted Standard: SJ/T 1145; SJ/T 1146
Regulation (derived from): Industry-Science (2010) No. 77
Summary: This standard applies to a thickness under normal weather conditions or under 2 ~ 50��m organic thin film capacitors with high temperature, the frequency of the measured values ??and the tangent of the dielectric loss angle of the dielectric constant 50Hz, 1kHz or 1MHz time.

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