Q/BQB 475-2018 (Q/BQB 475-2023 Newer Version) PDF English
Q/BQB 475-2018 (Q/BQB475-2018, QBQB 475-2018, QBQB475-2018)
Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Name of Chinese Standard | Status |
Q/BQB 475-2023 | English | 249 |
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Cold-rolled steel strip for electrolytically zinc coated baseplate
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Q/BQB 475-2018 | English | 90 |
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Cold rolled steel strip for electrogalvanized substrates
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Newer version: Q/BQB 475-2023 Standards related to (historical): Q/BQB 475-2023
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Q/BQB 475-2018: PDF in English (QBQB 475-2018) Q/BQB 475-2018
BQB
ENTERPRISE STANDARD OF BAOSHAN
IRON & STEEL CO., LTD.
Cold rolled steel strip for electrogalvanized substrates
Issued on. February 05, 2018
Issued by. Baoshan Iron & Steel Co., Ltd.
Table of Contents
Self-commitment ... 3
1. Chemical composition ... 5
2. Mechanical properties ... 5
3. Inspection and test ... 5
Self-commitment
The contents of Q/BQB 475-2018 “Cold rolled steel strip for electrogalvanized
substrates”, prepared and published by our company, meet the requirements of
relevant national laws and regulations, mandatory standards, and related
industrial policies; and in accordance with the prescribed procedures, are
approved for release by the legal representative of the enterprise. The products
produced by our company meet the technical requirements stipulated in this
Standard. The standard number is clearly indicated on the corresponding
product packaging. Our company is responsible for the truthfulness, accuracy,
and legality of the declared public information, and assumes full legal
responsibility for the consequences of the implementation of this Standard.
Baoshan Iron & Steel Co., Ltd.
February 5, 2018
Technical Index 1
Index name. Main indexes such as chemical composition and
mechanical properties
Index requirements. Main indexes such as chemical composition and
mechanical properties, and test methods are shown
in the attachment
(See Page 4 for details)
...... Source: Above contents are excerpted from the PDF -- translated/reviewed by: www.chinesestandard.net / Wayne Zheng et al.
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