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JJF 1015-2014 PDF English (JJF 1015-2002: Older version)Search result: JJF 1015-2014 (JJF 1015-2002 Older version)
JJF1015-2014: PDF in EnglishJJF 1015-2014 NATIONAL METROLOGY TECHNICAL SPECIFICATION OF THE PEOPLE'S REPUBLIC OF CHINA Replacing JJF 1015-2002 General Norm for Pattern Evaluation of Measuring Instruments ISSUED ON: JANUARY 23, 2014 IMPLEMENTED ON: JULY 23, 2014 Issued by: General Administration of Quality Supervision, Inspection and Quarantine General Norm for Pattern Evaluation of Measuring Instruments Replacing JJF 1015-2002 Jurisdiction organization: National Technical Committee of Legal Metrology Metering Management Drafting organizations: Beijing Institute of Metrology Detection Beijing Bureau of Quality and Technical Supervision China National Institute of Metrology This Norm is entrusted to National Technical Committee of Legal Metrology Metering Management for the interpretation. Drafters of this Norm: Wang, Zigang (Beijing Institute of Metrology Detection) Chen, Jinghua (Beijing Bureau of Quality and Technical Supervision) He, Zhao (China National Institute of Metrology). Table of Contents Foreword ... 5 1 Scope ... 7 2 Normative references ... 7 3 Terms and definitions ... 7 4 Technical information and test prototype that shall be submitted by the application organization ... 8 5 Pattern evaluation ... 9 6 Handling of test prototype ... 12 7 Handling of technical information ... 13 Annex A Pattern Evaluation Report Format ... 14 Annex B Format for “Explanation” on Prototype Retention of Pattern Evaluation ... 19 Foreword JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring Instruments" is a guiding technical specification for pattern evaluation of measuring instruments. JJF 1015-2014 "General Norm for Pattern Evaluation of Measuring Instruments" was modified on the basis of JJF 1015-2002 "General Norm for Pattern Evaluation and Pattern Approval of Measuring Instruments", which references to partial contents of No.19 "Pattern evaluation and pattern approval" of International Organization for Legal Metrology (OIML) and combines with the relevant requirements proposed by the metrological administrative department. Compared with JJF 1015-2002, this Norm is only related to the pattern evaluation of the measuring instruments. The pattern approval shall be specified by relevant documents issued by the metrological administrative department. The main changes of this revision are as follows: - Add terms "single product" and "series product" ( see 3.3 and 3.4 ); - Add "Application for Pattern Approval of Measuring Instruments that was accepted and entrusted by the government metrological administrative department" in the submitted technical information (see 4.1); - Make significant change in the submitted test prototype (see 4.2); - Improve the approved pattern or specify the basis-change of the previous pattern evaluation (see 5.1); - Refine the examination of technical information to make it more operatable (see 5.2); - Divide the pattern evaluation into observation project and test project, so as easy for description (see 5.3 and 5.4); - Add "function verification" (see 5.4.1); - Refine "stability test" (see 5.4.7); - Change the way of "determination of pattern evaluation result"; it shall be determined as qualified only when all the items for evaluation are qualified (see 5.5); - Enrich the "pattern evaluation report" by requiring records and photos to be listed in the report as attachment (see 5.6); - Change the handling of test prototype (see 6); - Refine the "notices" of "pattern evaluation report" and specify 15-day appeal period (see Appendix A); - Add tables of "measurement parameters for measuring instruments", "critical parts and materials", "list of equipment for pattern evaluation" and "list of evaluation items and evaluation results"; - Delete contents relating to pattern approval; - Delete basic safety test; - Delete tests for adaptability of measuring performance in transport simulation and retention simulation; - Delete "handling for the first test failure". The previous versions of this Norm are: - JJF 1015-2002; - JJF 1015-1990. General Norm for Pattern Evaluation of Measuring Instruments 1 Scope This Norm is applicable to pattern evaluation of measuring instruments and approved pattern’s compliance examination. 2 Normative references This Norm takes the following documents as reference: JJF 1016-2014 The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments; JJF 1051 Designation and Classification Code for Measuring Instruments; JJF 1069 Rules for the Examination of the Service of Legal Metrological Verification. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. 3 Terms and definitions Terms and definitions defined by JJF 1001 "General Terms in Metrology and Their Definitions" AND the following terms and definitions are applicable to this Norm. 3.1 Measuring instrument The single device or combination with one or multiple auxiliary equipment, which are used for measuring. 3.2 Type (pattern) evaluation The systematical examination and test on performance of one or multiple samples in specified pattern according to document requirements on measuring instruments, of which the results are written in the pattern evaluation report to confirm if the pattern can be approved. Note: The pattern of measuring instruments refers to the prototype as well as its technical information (e.g., drawings, design material, software documents, etc.) of a certain measuring instrument. 3.3 Single product The product of one specification or model. 3.4 Series product A group of products with same measuring principle, same or similar structure (appearance), which meet one of the following conditions: 1) With same accuracy but with different measurement range; 2) With different accuracy but with same measuring range and structure. 4 Technical information and test prototype that shall be submitted by the application organization The applicant shall provide the technical information and test prototype required by pattern evaluation to the technical agency who undertakes the pattern evaluation. 4.1 Technical information The following technical information shall be provided in two-sets by the applicant: - "Application for Pattern Approval of Measuring Instruments" accepted and entrusted by the government metrological administrative department; - Product standard; - Assembly drawing, circuit diagram and critical parts list; - Instructions for use; - Test report made by manufacturer or technical agency; - Explosion-proof certificate shall be provided if the test is carried out in the explosive environment; - Software evaluation report (if the government metrological administrative department requires) issued by authorized agency. 4.2 Test prototype The technical agency who undertakes the pattern evaluation shall require the applicant to provide the test prototype according to provisions of pattern evaluation outline if there is any; otherwise, determine the specification and quantity of the prototype according to provisions of 6.13 of JJF 1016-2014. 5 Pattern evaluation 5.1 General principles The pattern evaluation shall be carried out according to the pattern evaluation outline. The pattern evaluation includes technical information submitted for review, observation item evaluation, and editing of pattern evaluation report. Generally, the pattern evaluation shall be completed within 3 months. If there is stability test of the measuring instrument, the evaluation period can be appropriately extended; however, it shall be stated in advance to the government metrological administrative department who entrusts the pattern evaluation and to the applicant. If the basis of the previous pattern evaluation is changed, it shall re-evaluate or partially evaluate according to the requirements in the foreword of new pattern evaluation outline. It shall review the approved pattern that has been improved. The items for evaluation shall be determined by the technical agency who undertakes the pattern evaluation according to the specific improvement. 5.2 Review of technical information 5.2.1 Comparing with 4.1 of this Norm, review if the technical information is complete. 5.2.2 Review if the units of measurement, the external structure, marks, anti- spoofing measures, etc. are in line with the legal management requirements. Meanwhile, review if the names of measuring instruments comply with provisions of JJF 1051 and the "Catalogue of Measuring Instruments under the Legal Administration of the People's Republic of China (Pattern Approval)." 5.2.3 Review if the product standard of which this Norm is based on, measurement indicators, functions and technologies in the user manual meet the requirements of the pattern evaluation outline. 5.2.4 The technical information that are reviewed as qualified shall be marked with paging seal as review confirmation. The review organization, reviewer, review date as well as pattern evaluation report number shall be indicated on the mark. Return the unqualified technical information for review to the applicant. Resubmit for review after modification by the applicant. 5.3 Observation item evaluation Evaluate the items requiring no test in legal management requirements, metering requirements and common technical requirements proposed by the pattern evaluation outline, and fill the observation record table with evaluation conclusion of each item. 5.4 Evaluation of test item It shall record test data and test results of the following tests. 5.4.1 Function verification Verify if the measuring instrument is equipped with each function specified in the pattern evaluation outline, and if each function meets the requirements. 5.4.2 Test of measuring function Carry out the test under reference conditions specifi.......Source: https://www.ChineseStandard.net/PDF.aspx/JJF1015-2014 |