GB/T 36504-2018 English PDF

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GB/T 36504-2018: Guide for the analysis of the printed circuit board surface contamination -- Auger electron spectroscopy
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 36504-2018	199	Add to Cart	3 days	Guide for the analysis of the printed circuit board surface contamination -- Auger electron spectroscopy	Valid

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Basic data

Standard ID: GB/T 36504-2018 (GB/T36504-2018)
Description (Translated English): Guide for the analysis of the printed circuit board surface contamination -- Auger electron spectroscopy
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: G04
Classification of International Standard: 71.040.40
Word Count Estimation: 10,186
Date of Issue: 2018-07-13
Date of Implementation: 2019-06-01
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 36504-2018: Guide for the analysis of the printed circuit board surface contamination -- Auger electron spectroscopy

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Guide for the analysis of the printed circuit board surface contamination--Auger electron spectroscopy ICS 71.040.40 G04 National Standards of People's Republic of China Analysis of surface contamination of printed circuit boards Auger electron spectroscopy Published on.2018-07-13 2019-06-01 implementation State Market Supervisory Administration China National Standardization Administration issued

Content

Foreword I Introduction II 1 Scope 1 2 Normative references 1 3 Definition of terms 1 4 Method Overview 1 5 Sample preparation and installation 2 6 Analysis step 3 7 Measurement Report 6 Reference 7

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38). This standard was drafted. Tsinghua University, Nanjing Information Engineering University. The main drafters of this standard. Yao Wenqing, Yang Liping, Tengfei, Xu Tongguang, Yan Yi, Li Zhanping, Wang Yajun, Chen Sheng, Zhu Yongfa.

Introduction

With the development of high technology, it is necessary to improve the functions and performance of electronic products, and highly integrated process requirements make printed circuit boards more and more In the direction of micro-fine, there are increasingly demanding requirements for device surface technology. Thus, the contamination of the printed circuit board surface It is vital. Auger electron spectroscopy (AES) has high surface sensitivity and its detection depth is about 3~10 atomic monolayer (0.4nm~5nm). The detection limit is 10-3 atomic concentration, and the spatial resolution can reach 4nm. It can be used to analyze the properties of Li-U elements other than hydrogen and helium. Volume analysis is widely used for surface chemical analysis of materials. This standard specifies a method for measuring the surface contamination of printed circuit boards by a high-resolution Auger electron spectrometer for printed circuit boards. Failure analysis provides a reference. Analysis of surface contamination of printed circuit boards Auger electron spectroscopy

1 Scope

This standard specifies a method for accurately measuring the surface contamination of a gold-plated finger on a printed circuit board PCB (printed circuit board). Method---Russian Electron Spectroscopy (AES). This standard applies to the accurate measurement of the distribution of nanoscale elements with a certain conductive solid surface.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 22461-2008 Surface chemical analysis vocabulary GB/T 26533-2011 General rules for Auger electron spectroscopy GB/T 29731-2013 Surface chemical analysis High-resolution Auger electron spectrometer element and chemical state analysis with energy calibration GB/T 29557-2013 Surface chemical analysis depth analysis sputtering depth measurement GB/T 30815-2014 Surface chemical analysis analysis sample preparation and installation method guide GB/T 32565-2016 Surface chemical analysis Auger electron spectroscopy (AES) data recording and reporting requirements GB/T 32998-2016 Surface chemical analysis Auger electron energy spectrum charge control and calibration method report specification requirements

3 Terms and definitions

The terms and definitions defined in GB/T 22461-2008 apply to this document.

4 Method Overview

4.1 ionization cross section The ionization cross section is the cross section of a process in which a vacancy is created in a shell of an atom that has been occupied by electrons. Is a beam of electron bombardment samples At the time, the energy of the primary electron beam causes the atomic inner shell to ionize and form a vacancy. According to the semi-empirical method, the ionization cross section can be calculated by the formula (1). QW= 6.51×10-14aWbW E2W Uln 4U 1.65 2.35e(1-U) Êê Úú (1) In the formula. QW --- ionization cross section of the atom, in square centimeters (cm2); The ionization energy of EW--W level electrons, the unit is electron volts (eV); U --- ratio of excitation source energy to energy level ionization energy, EP/EW; EP --- the energy of incident electrons (primary electrons) in electron volts (eV); aW, bW --- constant. The ionization cross section QW is a function of the excitation source energy and the energy level ionization energy ratio U. When U is 2.7, the ionization cross section can reach a maximum. ......

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